The small radiation surface pulse simulator is a device used to simulate sunlight and collect the volt ampere characteristic curve of crystalline silicon photovoltaic cells. It generally consists of a light source system, a power system, an acquisition system, an infrared temperature probe, a reference battery, a display, a computer (including testing software), etc.
The small radiation surface pulse simulator is a device used to simulate sunlight and collect the volt ampere characteristic curve of crystalline silicon photovoltaic cells. It generally consists of a light source system, a power system, an acquisition system, an infrared temperature probe, a reference battery, a display, a computer (including testing software), etc.
Small surface pulse simulatorAdopting A+A+A+class xenon lamp transient light source that meets the IEC60904-9:2020 standard, the irradiation intensity can be adjusted to 200-1200W/m2, and the equipment has temperature correction and light intensity correction functions, as well as monitoring of irradiance status. This device can be used for measuring I-V curves, P-V curves, irradiance lines, short-circuit current, open circuit voltage, peak power, peak power point voltage, current, fill factor, conversion efficiency, series resistance, parallel resistance, and other parameters of conventional polycrystalline, monocrystalline PERC, TopCon, heterojunction, CIGS, GaAs, CdTe, and IBC battery components.
Product parameters of small radiation pulse simulator
| Adaptation standards | IEC60904-9:2020 |
| Light source type | Xenon lamp transient light source |
| spectral range | 300-1200nm |
| Light source grade | 1. Spectral matching degree: 0.875-1.125 A+ 2. Irradiance non-uniformity: ≤ 1% A+ 3. Irradiance instability: ≤ 1% A+ |
| Range of irradiance | 200W/㎡~1200W/㎡ |
| Test area | 500 * 500mm (other sizes can be customized) |
| pulse width | 10-100ms, Adjustable every 1ms step |
| Repeatability accuracy | ≤0.1% |
| Testing Technology | Standard configuration includes linear scanning, advanced hysteresis algorithm, integrated successive approximation method (SAT), intelligent testing method (IAT), and peak holding test function |
| Test battery | Perc and Topcon、BC、 Heterojunction and other high-capacity battery components |
| Additional items that can be added | 1. EL testing system, realizing IV/EL testing at the same workstation 2. Integrated IR infrared thermal imager to achieve hot spot testing 3. WPVS battery, achieving absolute measurement 4. Low irradiance filter for low irradiance testing |