High power 600W monochromatic Al K α X-ray source ensures high analytical sensitivity
A double-layer energy analyzer with an average radius of 165mm ensures high energy resolution XPS analysis and high spatial resolution XPS imaging
The patented immersion magnetic lens technology significantly improves analysis sensitivity
The fast parallel X-ray photoelectron real-time imaging of the patent has a spatial resolution of better than 3 μ m and a maximum pixel of 65536 (256 × 256), which can perform micro area element and chemical state spatial distribution analysis
The patented coaxial ultra-low energy shadowless single electron source charge neutralizer perfectly solves the XPS analysis of insulators
The patented two-dimensional array delay line detector can simultaneously record the intensity and emission position of photoelectrons, enabling the acquisition of high-energy resolution XPS spectra within seconds
Fully automatic sample stage, capable of analyzing large samples of 100mm × 100mm
Energy resolution better than 0.45eV (Ag 3d5/2)
Conventional analysis with high energy resolution and sensitivity 0.55eV@1.1Mcps (Ag 3d5/2)
The analysis energy resolution and sensitivity of insulator analysis are as high as 0.68eV@16kcps (C 1s of PET)
The Vision software, which combines data collection and processing, can run on various platforms such as Windows XP/Vista/7, achieving powerful functions such as real-time display of vacuum degree in each vacuum chamber, control of vacuum valve opening and closing, experimental condition setting, and fully automatic unmanned analysis