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E-mail
info@hioki.com.cn
- Phone
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Address
Room 4705, Raffles Plaza, 268 Xizang Middle Road, Huangpu District, Shanghai
Rizhi (Shanghai) Measurement Technology Co., Ltd
info@hioki.com.cn
Room 4705, Raffles Plaza, 268 Xizang Middle Road, Huangpu District, Shanghai
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RM3542-01 |
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A resistance meter used to test ultra-low or low parallel resistance
Accuracy of ± 0.16% and resolution of 0.01 μ Ω in automation systems
● High precision in repeated measurements
● Provide high-performance contact inspection function, comparator function, and data output function
● Intuitive user interface, strong anti-interference ability, most suitable for automatic integration
The host does not include measuring fixtures. Please select the measuring fixture from the options.

The resistance meter RM3543 can measure DC resistance such as 0.1m Ω low shunt resistance with high precision of ± 0.16% and high resolution of 0.01 μ Ω. (※ Set the condition to a 10m Ω range, measure the speed SLOW, and average 16 times)

Thermoelectric potential refers to the potential difference generated by the contact parts of different metals (as shown in the figure). Specifically, the contact area between the vehicle probe and the measuring object, as well as the contact area between the measuring instrument and the measuring probe. The magnitude of thermoelectric potential varies depending on the temperature of the measurement environment, and the larger the temperature difference, the greater the thermoelectric potential. RM3543 is equipped with bias voltage compensation function, which allows test current to flow through both positive and negative sides. After using their respective detection voltages, the influence of thermoelectric potential is removed.

By using the zoom function, it is possible to compensate for the difference in resistance values during actual installation and when checking separately (such as the influence of detection position). Plays a role in checking low resistance current detection resistors such as shunting.

When in contact with the test object, the oxide film and dirt between the probe and the test object can be punctured to improve the contact state. By improving poor contact, stable measurement can be achieved and the contact error rate can be reduced, thereby providing production efficiency.

If there is a metal foreign object between the POT-CUR of the vehicle probe, the 4-terminal connection cannot be completely guaranteed. Measure the resistance value between POT-CUR during non measurement and check for any short circuit abnormalities in the probe.