Reference material for ultra-high purity silicon powder standard

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Reference material for ultra-high purity silicon powder standardLarge quantity of spot goods, welcome to purchase, win-win cooperation.

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The NIST SRM 640g was developed by the National Institute of Standards and Technology (NIST) in the United StatesReference material for ultra-high purity silicon powder standardQuality is mainly used for the calibration of X-ray powder diffraction (XRD) instruments and is a key benchmark for crystal structure analysis in fields such as materials science, semiconductors, and chemical engineering.

Core parameters and applications

Main purpose: As a standard for diffraction line position (2 θ angle) and line shape (peak width), used for calibration and performance verification of XRD instruments.

Specification: Each bottle weighs approximately 7.5 grams and is sealed in an argon environment to prevent moisture absorption and contamination.

Material source: Made from ultra-high purity intrinsic silicon ingots provided by Siltronic AG in Germany, crushed and jet milled to a median particle size of 4.1 μ m, and annealed in argon gas at 1000 ℃ for 2 hours to eliminate lattice stress.

Certification value: At 22.5 ℃, the lattice parameter is 0.5431144 nm ± 0.000008 nm, and the measurement value is traceable to the International System of Units (SI), with high accuracy and comparability.

Uniformity: XRD analysis shows that the material is highly uniform in terms of diffraction characteristics, with a relative lattice change of ≤± 4.8 × 10 ⁻⁸ (95% confidence interval).

Usage and Storage Standards

Applicable instruments: XRD equipment adapted to Bragg Brentano geometry, which can be calibrated for 2 θ angle and full width at half maximum (FWHM) using basic parameter method or Pawley refinement.

Storage conditions: Store at ambient temperature. Unused parts must be sealed in the original bottle and protected with argon gas to avoid contamination or moisture.

Certification validity period: It is valid indefinitely within the specified uncertainty range and does not require regular re certification. However, if the material is damaged, contaminated, or mishandled, the certification will become invalid.

Extended Information

This standard also provides information values, such as the full width at half maximum (FWHM) of the Lorentz distribution, to evaluate the broadening effect caused by the sample, corresponding to an average volume weighted domain size of approximately 0.4 µ m. In addition, the particle size distribution was determined by laser scattering, with a typical median particle size of 4.1 μ m.