Power Meter

NegotiableUpdate on 02/09

Model

Nature of the Manufacturer: Producers

Product Category

Place of Origin

Online Consult

Overview

Product Details

Is the power tester used? Can xenon lamps be used as steady-state light sources for crystalline silicon, perovskite, and stacked batteries? IV testing of its corresponding components. The equipment is mainly equipped with a light source control system, power control system, testing system, constant temperature system, infrared temperature probe, reference battery, computer, display, etc.

Can the device achieve standard I-V and V-I scanning? Does it have MPPT (Maximum Power Point)? Multiple testing techniques such as power point tracking and I-t (constant voltage). Can obtain I-V curve, P-V curve, irradiance curve, short-circuit current, open circuit voltage, peak power, peak power point voltage and current, constant voltage point current, filling factor? Test parameters such as conversion efficiency, series resistance, and parallel resistance.

Product parameters of power tester

Adaptation standards	IEC60904-9:2020


Light source type	Xenon lamp steady-state light source


cooling method	Customized air cooling


light source lifetime	＞1000h


spectral range	300-1200nm


Light source grade	1. Spectral matching degree 0.875-1.125 A+ 2. Uneven irradiance ≤2% A 3. Irradiance instability ≤1% A+




Range of irradiance	200W/㎡~1200W/㎡


Test area	1.200200mm；2.240240mm；3.300300mm；4.320320mm；5.Customizable in other sizes




test mode	The steady-state test mode can be freely set from 1 second to continuous illumination


Multi channel design	36 channels can be tested simultaneously, and the number of channels can be customized


Testing Technology	Equipped with I-V and V-I scanning modes as standard, it has multiple testing technologies such as MPPT (Maximum Power Point Tracking) and I-t (Constant Voltage), which can be switched through software. At the same time, it integrates point by point scanning mode (meeting the scanning mode with a minimum step time of ≤ 0.2s)


Test battery	Polycrystalline, monocrystalline Topcon、BC、 Heterojunction CIGS、GaAs、CdTe、 Perovskite, perovskite stack, etc


Additional items that can be added	1.Integrated temperature control system to achieve temperature coefficient testing 2.integrationELTest the system to achieve the same workstationIV/ELtest 3.customizable0BBTesting fixtures, perovskite adaptation fixtures 4.integrationIRInfrared thermal imager for hot spot testing 5.Glove box (Mikolana)

Adaptation standards Standard	IEC60904-9:2020	IEC60904-9:2020
Light source type Light type	Xenon lamp steady-state light source	Xenon Lamp
cooling method Cooling	Customized air cooling	Forced air cooling
light source lifetime Light source lifetime	＞1000h	＞1000h
spectral range Spectrum wavelength	300-1200nm	300-1200nm
Light source grade Classfication of light source	Spectral matching degree 0.875-1.125 A+ Irradiance non-uniformity ≤ 2% A Irradiance instability ≤ 1% A+	Spectral match is 0.875-1.125, class A+ Irradiance non-uniformity is ≤2%, class A Irradiance instability is ≤1%, class A+
Range of irradiance Irradiance intensity	200W/㎡~1200W/㎡	200W/㎡~1200W/㎡
Test area Illumination area	 200200mm 240240mm  300300mm 320320mm  Other sizes can be customized	 200200mm 240240mm  300300mm 320320mm  Other size can be customized
Test mode Test mode	The steady-state test mode can be freely set from 1 second to continuous illumination	Under steady-state mode, it can be set freely from 1s to continuous illumination. Besides
Multi channel design Multi-channel testing design	36 channels can be tested simultaneously, and the number of channels can be customized	36 channels can be tested simultaneously, and the number of channels can be customized
Testing Technology Testing technology	Equipped with I-V and V-I scanning modes as standard, it has multiple testing technologies such as MPPT (Maximum Power Point Tracking) and I-t (Constant Voltage), which can be switched through software. At the same time, it integrates point by point scanning mode (meeting the scanning mode with a minimum step time of ≤ 0.2s)	It equipped with I-V, V-I scanning, MPPT (maximum power point tracking), I-t (constant voltage) and other test technologies, all these technologies can be switched by software. It also equipped point-by-point scanning ( meet the shortest scanning in step of ≤0.2s
Test battery Measurable cell type	Polycrystalline, monocrystalline Topcon、BC、 Heterojunction CIGS、GaAs、CdTe、 Perovskite, perovskite stack, etc	Poly-crystalline, Mono-crystalline, TopCon, HJT, BC,CIGS, GaAs, CdTe and Perovskite
Additional items that can be added Optional service	Integrated temperature control system to achieve temperature coefficient testing Integrate EL testing system to achieve same workstation IV/EL testing Customization of 0BB testing fixtures and perovskite adaptation fixtures is available Integrated IR infrared thermal imager for hot spot testing Glove box (Mikolana)	 Temperature Chamber can be integrated to achieve measurement of temperature coefficient  EL testing system can achieve IV and EL testing at a same production section  Jigs for 0BB cells and perovskite can be customized.  Integrated with IR infrared thermal imager to realize heat spot testing  Glove box（MIKROUNA）