Specification: Model: Quantity: Brand: Packaging: Price: Thermal Noise Micro Atomic Force Microscope. Applied for academic research, training, and quality control. Innovative technology with superior performance can be built in one hour. University technical specifications: Commercially available cantilever free column scanning range: 120x120x40 μ m or 40x40x4 μ m Contact type,
| Specifications: |
Model: |
Quantity: |
| Brand: |
Packaging: |
Price: |
Thermal Noise
Micro atomic force microscope
Applied to academic research training and quality control
Innovative technologies with superior performance
Can be built within one hour
niversity
technical specifications
Commercially viable cantilever free sorting
Scanning range: 120x120x40 μ m or 40x40x4 μ m
Contact type, dynamic phase imaging, and MFM mode
65 fm √ Hz noise floor
2 μ m resolution integrated optical microscope
Full HD Camera, Field of View 390x230, Pixel 1920x1080, 30fps
24 bit ADC/DAC
FPGA/DSP digital feedback
Forever free software upgrade
Unrestricted user access permissions
USB and WIFI interfaces
Sample size: 10x10x5mm (unlimited sample sizes can be configured)
Scalable imaging
Scratch lithography
Liquid cells
attachment
Signal access module
38mm stroke XY electric sample locator
2mm stroke XY manual sample locator