Overview
The PGP77 ICP spectrometer is a specialized instrument used to detect impurities such as silicon in the petrochemical industry, including petroleum, gasoline, and lubricants. Its testing accuracy is better than atomic absorption, especially for silicon elements that cannot be measured by atomic absorption. The sensitivity and detection performance of ICP spectrometers for other elements measured by atomic absorption spectroscopy are better. PGP77 ICP spectrometer is ...
Product Details
PGP77 ICP Spectrometer
Overview
The PGP77 ICP spectrometer is a specialized instrument used to detect impurities such as silicon in the petrochemical industry, including petroleum, gasoline, and lubricants.
Its testing accuracy is better than atomic absorption, especially for silicon elements that cannot be measured by atomic absorption. The sensitivity and detection performance of ICP spectrometers for other elements measured by atomic absorption spectroscopy are better.
Main performance parameters
1. Wavelength range: 180-800nm (2400 lines/mm) or 180-500nm (3600 lines/mm)
2. Resolution: Within the entire wavelength range of 180-500nm, the resolution is ≤ 0.006nm
3. Wavelength indication error and repeatability: wavelength indication error ≤ 0.02nm, repeatability ≤ 0.003nm
4. Scanning step distance: up to 0.0004nm
5. Precision: RSD ≤ 1.5%
6. Stability: RSD ≤ 2.0%
7. Detection limit: PPb level
8. Analysis element range: Can perform quantitative and qualitative analysis on 72 metallic elements and some non-metallic elements (such as B, P, Si, Se, Te)
9. Linear range: 7 orders of magnitude or more.
10. Analysis speed: Scan more than 20 elements per minute
11. Level certificate: National Measurement Instrument Form License A-level
Detailed parameters of each component
Automatic plasma emission spectrometer RF generator (RF)
(1) Circuit type: Inductive feedback self-excited oscillation circuit, coaxial cable output, matching tuning, taking power feedback signal for closed-loop automatic control
(2) Operating frequency: 40.68MHz ± 0.05%
(3) Frequency stability: ≤ 0.05%
(4) Output power: 800-1500W, automatically adjustable
(5) Output power stability: ≤ 0.3%
(6) Electromagnetic field leakage intensity: 20cm away from the fuselage, electric field intensity E:<2 V/m
Fully automatic plasma emission spectrometer sampling device
(1) Output working coil: inner diameter 25mm, 3 turns
(2) Torch tube: Three concentric quartz torch tube with an outer diameter of 20mm
(3) Coaxial spray: outer diameter 6mm
(4) Double tube fog chamber: outer diameter 34mm
(5) Observation position: Vertical observation of height and horizontal observation of front and back can be intuitively adjusted through software
(6) Specification of argon flowmeter and carrier gas pressure gauge:
1. Plasma gas flowmeter: (100-1000) L/h (1.6-16L/min)
2. Auxiliary gas flow meter: (10-100) L/h (0.16-1.66L/min)
3. Carrier gas flow meter: (10-100) L/h (0.16-1.66L/min)
4. Carrier gas stabilizing valve: (0-0.4Mpa) L/h
5. Cooling water: Water temperature: 21-26 ℃ Flow rate>5L/min Water pressure>0.1Mpa Cooling water: Electrical resistivity>1M Ω
Fully automatic plasma emission spectrometer spectrometer spectrometer
(1) Optical path: Czerny Turner
(2) Focal length: 1000mm
(3) Grating specifications: ion etched holographic grating; Engraving density 3600 lines/mm, engraving area: 80 × 110mm
(Or engraved line density 2400 lines/mm, engraved line area: 80 × 110mm)
(4) Reciprocal of linear dispersion rate: 0.26nm/mm
(5) Resolution: ≤ 0.007nm (entire band)
(6) Scanning wavelength range: 180-500nm, 3600 lines/mm;
180-800nm, 2400 engraved lines/mm
(7) Scanning step distance: 0.0004nm
(8) Exit and entrance slits: 20 μ m × 25 μ m
(9) Mirror specification: (78 × 105 × 16) mm
(10) Lens: φ 30, 1:1 imaging
(11) Mirror specification: concave
(12) Temperature control device for spectrometer: 34 ℃± 0.5 ℃
Automatic plasma emission spectrometer metering device
(1) Photomultiplier tube specifications: Japanese high-efficiency R212UH or R928
(2) Negative high voltage of photomultiplier tube: 200-1000V, automatic adjustment, stability<0.01%
(3) Measurement range of photomultiplier tube current: 10-4-10-9A
(4) Signal acquisition is V/F exchange: 1mV corresponds to 100Hz
(5) Sampling circuit: using high-precision operational amplifiers from abroad to greatly improve the sensitivity and accuracy of the instrument
(6) Instrument data acquisition: Connected to a computer through a serial port, simplifying the circuit and making the connection more convenient
(7) Metering method: sequential measurement of single and multiple elements
Automatic plasma emission spectrometer operating software:
(1) Operating systems: Windows XP, Windows 7Windows 10operating platform
(2) Measuring the number of wavelengths: arbitrary selection
(3) Analysis speed: More than 20 elements per minute
(4) Database: spectral line library with over 110000 lines
(5) Multi window: After measuring one result, the previous result can be retained in the display window while measuring the next sample;
(6) Standard addition method: Software should have a standard addition method for use under different conditions and applications
(7) Analysis mode: The software defaults to the analysis mode, which has various functions such as instrument diagnosis, spectral analysis, several measurement methods, several integration modes, and unit selection
(8) Historical database: In the historical database, you can selectively print the batch analysis results you want to print at the same time
(9) Data output: The software supports laser printers to print analysis results
PGP77 ICP spectrometer
Overview
PGP77 ICP spectrometer is an instrument specially used to detect other impurity elements such as silicon, petroleum, gasoline, lubricating oil and other petrochemical industries.
Its test accuracy is better than atomic absorption, especially the silicon element that can not be measured by atomic absorption. The sensitivity and detection performance of other atomic absorption spectroscopy elements ICP spectrometers are better.
Main performance parameters:
1. Wavelength range: 180-800nm (2400 reticle/mm) or 180-500nm (3600 reticle/mm)
2, resolution: the resolution in the entire band of 180-500nm ≤ 0.006nm
3, wavelength indication error and repeatability: wavelength indication error ≤ 0.02nm, repeatability ≤ 0.003nm
4, scanning step: up to 0.0004nm
5, precision: RSD ≤ 1.5%
6, stability: RSD ≤ 2.0%
7, detection limit: PPb level
8. Analysis of element range: quantitative and qualitative analysis of 72 metal elements and some non-metal elements (such as B, P, Si, Se, Te)
9, linear range: 7 orders of magnitude or more.
10, analysis speed: scan more than 20 elements per minute
11, grade certificate: national measurement instrument form license A level
Detailed parameters of each component:
Fully automatic plasma emission spectrometer RF generator (RF)
(1) Circuit type: Inductive feedback self-excited oscillation circuit, coaxial cable output, matching tuning, taking power feedback signal, performing closed-loop automatic control
(2) Working frequency: 40.68MHz ± 0.05%
(3) Frequency stability: ≤0.05%
(4) Output power: 800-1500W, automatic adjustment
(5) Output power stability: ≤0.3%
(6) Electromagnetic field leakage intensity: 20cm from the fuselage, electric field strength E: <2 v=''>2>
Fully automatic plasma emission spectrometer sample introduction device
(1) Output working coil: inner diameter 25mm, 3 匝
(2) Torch: three concentric type, quartz torch with outer diameter of 20mm
(3) Coaxial sprayer: outer diameter 6mm
(4) Double cylinder type fog chamber: outer diameter 34mm
(5) Observation position: before and after the horizontal observation, horizontal and horizontal observation, can be intuitively adjusted by software
(6) Argon gas flowmeter specifications and carrier gas pressure gauge specifications:
1. Plasma gas flow meter: (100-1000) L/h (1.6-16L/min)
2. Auxiliary gas flowmeter: (10-100) L/h (0.16-1.66L/min)
3. Carrier gas flowmeter: (10-100) L/h (0.16-1.66L/min)
4, carrier gas regulator valve: (0-0.4Mpa) L / h
5, cooling water: water temperature: 21-26 ° C flow rate > 5L / min water pressure > 0.1Mpa cooling water: resistivity > 1MΩ
Fully automatic plasma emission spectrometer splitter
(1) Light path: Czerny-Turner
(2) Focal length: 1000mm
(3) Grating specification: ion etching holographic grating; engraved line density 3600 lines/mm, engraved area: 80×110mm
(or engraved line density 2400 lines / mm, engraved area: 80 × 110mm)
(4) Reciprocal rate of line dispersion rate: 0.26nm/mm
(5) Resolution: ≤0.007nm (whole band)
(6) Scanning wavelength range: 180-500 nm, 3600 reticle/mm;
180-800nm, 2400 lines/mm
(7) Scanning step: 0.0004 nm
(8) Exit, incident slit: 20μm × 25μm
(9) Mirror specifications: (78 × 105 × 16) mm
(10) Lens: φ30, 1:1 imaging
(11) Mirror specifications: concave
(12) Spectrometer thermostat: 34 °C ± 0.5 °C
Fully automatic plasma emission spectrometer photometric device
(1) Photomultiplier tube specifications: Japan high efficiency R212UH or R928
(2) Photomultiplier tube negative pressure: 200-1000V, automatic adjustment, stability <>
(3) Photomultiplier tube current measurement range: 10-4~10-9A
(4) Signal acquisition is V/F exchange: 1mV corresponds to 100Hz
(5) Sampling circuit: using foreign high-precision operational amplifiers, the sensitivity and accuracy of the instrument are greatly improved.
(6) Instrument data acquisition: It is connected to the computer through the serial port, which simplifies the circuit and makes the connection more convenient.
(7) Metering method: single and multi-element sequential measurement
Fully automatic plasma emission spectrometer operating software:
(1) Operating system: Windows XP or Windows 7 operating platform
(2) Measuring the number of wavelengths: arbitrarily selected
(3) Analysis speed: 20 elements or more per minute
(4) Database: more than 110,000 line libraries
(5) Multi-window: After measuring one result, the last result can be retained in the display window while measuring the next sample;
(6) Standard addition method: software must have standard addition method for use under different conditions and applications.
(7) Analysis mode: software default analysis mode, with instrument diagnosis, spectrum analysis and several measurement methods and several integration modes, unit optional and other functions
(8) Historical database: In the historical database, the batch analysis result that you want to print can be selectively printed at the same time.
(9) Data output: software supports laser printer to print analysis results