Beam analyzer, high-resolution CMOS, wide spectrum coverage, USB 3.0 high-speed transmission, real-time and accurate measurement of laser spot/energy distribution, anti overexposure, no ghosting, suitable for laser production line quality inspection and equipment integration, plug and play, stable and durable, matched with professional software, to meet industrial batch testing needs. Ophir Laser Spot Profile Analyzer Sensor Industrial Inspection
Produced in Ophir, IsraelIndustrial grade laser beam contour detection equipmentSpecially designed for laser manufacturing, laser processing equipment matching, production line quality inspection, scientific research experiments and other scenarios, with high precision, high stability, and easy integration characteristics, it has become the core testing tool for quality control in the laser industry. The device adopts a 1/1.8 inch 2048 × 1536 high-resolution global shutter CMOS with a small pixel size of 3.45 μ m, which can capture laser spots ranging from a minimum of 34.5 μ m to a maximum of 5.3mm. The spectrum covers 190-1100nm and is compatible with UV, visible light, near-infrared continuous and pulsed lasers, solving the problems of traditional camera near-infrared ghosting and overexposure, ensuring true and reliable measurement. USB 3.0 high-speed interface, full resolution 24fps real-time imaging, data transmission without delay, supports external trigger synchronization, and adapts to automated production line detection; Compact square body, C-shaped interface, sensor concave design, convenient installation inside the equipment or in narrow workstations, enhancing integration flexibility. Equipped with BeamGage professional beam analysis software, it can easily measure parameters such as spot size, ellipticity, uniformity, and divergence angle with just one click. The data can be exported and traced, meeting industry standards; The equipment has high resistance to damage, wide temperature operation (0-50 ℃), multiple international compliance certifications, long-term stable operation, and simple maintenance. As an imported original testing equipment, it has stable performance and reliable accuracy, effectively improving laser production yield and reducing quality inspection costs. It is the preferred solution for laser testing in the industrial and scientific research fields.
| parameter item |
Specification indicators |
|
|
| photosensitive chip |
Silicon CMOS, global shutter |
| effective pixels |
2048×1536 |
| wavelength range |
190–1100 nm |
| Spot measurement |
34.5μm–5.3mm |
| data interface |
USB 3.0 |
| frame rate |
24 fps |
| dynamic range |
72 dB |
| Trigger method |
Hardware/software trigger |
| Operating Temperature |
0–50℃ |
| Certification |
CE、UKCA、 China RoHS |


Ophir Laser Spot Profile Analyzer Sensor Industrial InspectionOphir Laser Spot Profile Analyzer Sensor Industrial Inspection