NanoMagnetics portable atomic force microscope

Atomic force microscope with a maximum scanning area of 120 µ m × 120 µ m × 40 µ m and a maximum resolution of 0.02nm

Atomic force microscope（AFM）It is a sub nanometer resolution surface scanning technique. This index refers to a series of non-destructive surface analysis techniques used at the nanoscale. Its resolution is higher than the resolution limit of optical microscopes10³ Twice. Atomic force microscopy is commonly used to obtain mechanical, functional, and electrical property data at the nanoscale, as well as for morphology (surface) studies.

According to Hooke's Law, when an atomic force microscope scans the surface morphology of a sample by bringing the tip of the cantilever close to the sample surface, the interaction force between the tip and the sample will change the degree of bending of the cantilever. Behind the device body, a beam of light emitted by a diode laser is focused and hit the back of the microcantilever. When the microcantilever bends, the reflected light spot will also shift, and the detector will record its motion trajectory in real time to obtain the surface morphology information of the sample.NanoMagnetics portable atomic force microscope

picture1Schematic diagram of the principle and structure of atomic force microscope

The user-friendly aspect of atomic force microscopy:

EzAFM/ezAFM+portable microscope isNanoMagnetics InstrumentsDesigned to address the pain point of traditional atomic force microscopes being bulky. It has the following advantages:

-Portable and compact:ezAFMThe atomic force microscope, including the operating computer, occupies only an area of70cm×30cmIt is one of the most portable atomic force microscopes currently available on the market.

-Durable and flexible adjustment:ezAFM/ezAFM+Portable microscopes can easily replace scanning heads while ensuring safety. It only takes a few minutes to switch from high-resolution scanning mode to a wide range scanning mode suitable for rougher surfaces.

-The operation is extremely simple:ezAFM/ezAFM+The scanning head of the portable microscope is equipped with a specially designed "alignment chip" that can be used in conjunction with commercially available probe cantilever beams. This unique system ensures that the laser and photodetector are aligned every time, making the replacement of the cantilever beam a simple and hassle free process without spending hours aligning the laser.

NMIAtomic Force MicroscopyAdvanced research features and scanning modes:

EzAFM atomic force microscope is aNanoMagnetics InstrumentsThe developed multifunctional platform is capable of executing multiple scanning modes to meet the research needs of users for surface morphology scanning.

-High resolution imaging: selection40x40x4 µmScanning head, achieving ultra-high resolution（0.02nmlevelZAxial resolution is very suitable for observing atomic level details on samples such as single-layer graphene.

-Large sample and rough surface analysis: selection120x120x40 µmScanning head, used for analyzing larger and rougher samples such as textiles, pulp, and biological structures.

-PortableAFMMicroscope contains multiple scanning modes(NMITransverse force microscope,portableNMIMagnetic force microscope, etc)：

Intermittent contact mode of ezAFM portable atomic force microscope for morphology measurement

2. NMI transverse force microscope（LFM）Used for friction analysis

3. PortableNMIMagnetic force microscope（MFM）Used for magnetic domain imaging

4.力-Distance spectrum（f-d）Used for analyzing the mechanical properties of materials

5. Optional liquid mode:ezAFMInstallation on portable atomic force microscopeAQUA™ The scanning head can perform stable and high-resolution surface morphology scanning on biological samples in native liquid environments.

6. Electric response force microscope, Kelvin probe force microscope, conductive atomic force microscope, scanning diffusion resistance microscope(ezAFM+New mode)

The lateral resolution performance of ezAFM atomic force microscope in different modes:

Seamless integration: glove box and inverted microscope

-Glove box integrationAFM：NanoMagneticsThe portable atomic force microscope can be miniaturized and remotely operated, making it easy to integrate into an inert atmosphere glove boxAFMMicroscopes can be used for the analysis of air sensitive samples.

-Combined with optical microscope:NanoMagneticsPortable atomic force microscope canezAFM-ILMThe system can be directly installed on an inverted optical microscope, allowing users to seamlessly manipulate nanoscale imagesAFMData is associated with optical imaging.

portableAFMMicroscope application cases and user groups:

The NMI portable atomic force microscope has been adopted by numerous research institutions and industrial laboratories worldwide, accumulating rich application cases. For example, inNASAIn the study of space materials, NMI atomic force microscopy is used to characterize the microstructure of thermal protective coatings and their applicationsharshEvolutionary behavior in the environment. In the research on new energy materials at Stanford University, researchers utilized portable materialsAFMmicroscopicKPFMMeasure the potential distribution on the surface of perovskite solar cells and study their photoelectric conversion mechanism and efficiency degradation reasons.

In addition to universities and research institutions, NanoMagnetics portable atomic force microscopes are also widely used in industrial research and development. Many semiconductor manufacturers use ezAFM portable atomic force microscopes for product quality control and process optimization, improving product yield through nanoscale defect detection. At the materials development company, researchers utilize the multi-mode imaging capabilities of NMI portable atomic force microscopes to evaluate the performance of newly developed polymer materials, composite materials, and functional coatings, accelerating the development process of new materials.

NMIAtomic force microscope parameter indicators:

-Commercial cantilever self alignment

-Two scanning ranges:120×120×40Mm，40×40×4Mm

-Contact mode,Dynamic force/Phase imaging mode,Lateral force microscopeLFMAnd magnetic microscopeMFMpattern

-65fm/√HZBase noise

-2mmIntegrated optical microscope with resolution

-Video camera:8MPVideo resolution,390×230MmField of view angle,3264×2448Pixels,30fpsThe frame rate

-24 digitsADC/DACdata collectionFPGA+DSPThe Digital Signal Processing System

-The sample size shall not exceed10×10×5mm(Optional version with unlimited size)

-USB interface

-Software upgrade and update

NMIAtomic Force Microscopy Extended Imaging Options:

-Scratch lithography method

-Scanning tunneling microscope（ezSTM）

-Liquid storage unit

-EzAFM+Expansion: Heating/Cooling table（-30℃-250℃）

NMIOptional accessories for atomic force microscope:

-Signal receiving module

-40mm strokeXYElectric sample locator

-2mm strokeXYManual sample locator

NanoMagnetics portable atomic force microscope