Mini temperature control probe station

NegotiableUpdate on 10/11

Model

Nature of the Manufacturer: Producers

Product Category

Place of Origin

Online Consult

Overview

In situ electrical testing platform, suitable for electrical testing of semiconductor materials and devices under variable temperature, designed to be compact, portable, and integrated with microscopy and spectroscopy systems.

Product Details

Temperature range -190 ℃~600 ℃, RT~1000 ℃ Temperature stability ± 0.05 ℃ Atmosphere protection, vacuum sample area 28x30mm Probe quantity 4 electrical connectors BNC triple coaxial BNC optional table potential electrical grounding triple coaxial back electrode optional adaptation Optical instrument Microscope spectrometer Ferroelectric dielectric electrochemical workstation Magnetic field electrical source meter Semiconductor analyzer DLTS