Metallographic microscope SC-50M

Metallographic microscope SC-50M

Research grade differential interference DIC metallographic microscope, 2K screen conductive particle indentation detection metallographic microscope

The all-new SC-50M research grade metallographic microscope is innovative in multiple aspects, closely following the international design trend in both appearance and performance, dedicated to expanding the new landscape of the industrial field. SC-50M adheres to the brand design concept of constantly exploring and surpassing, providing customers with comprehensive industrial testing solutions

Multi level spectral ratio observation head design

The all-new SC-50M series observation tube adopts a wide beam imaging system design, supporting 26.5mm leading ultra wide field of view observation, bringing you a new experience of large field of view. The two-stage positive image hinge three eye observation tube ensures that the direction of sample movement is consistent with the direction you observe through the eyepiece, making the operation more convenient.

Three stage hinge three eye observation tube, on the basis of using imaging light for binocular observation or three eye photography, an additional 20% for binocular observation and 80% for microscopic photography are added, making it convenient for users to compare and observe images under the microscope and video images simultaneously;

Polarization system

The polarization system includes polarizer and analyzer, which can be used for polarization detection. In semiconductor and PCB detection, it can eliminate stray light and provide clearer details. The analyzer is divided into fixed analyzer and 360 degree rotating analyzer. The 360 ° rotating analyzer can conveniently observe the state of the specimen under different polarization angles of light without moving the specimen. On the basis of the polarization system, a newly developed differential interferometer by Sunny can be loaded to establish a Normansky differential interference contrast system.

Normansky differential interference contrast system

The newly developed U-BICR differential interference component can convert subtle height differences that cannot be detected under bright field observation into high contrast brightness differences and express them in three-dimensional relief form, such as LCD conductive particles, precision disk surface scratches, etc.