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E-mail
emkete@emcrafts.com.cn
- Phone
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Address
Building 25, No. 9 Anningzhuang West Road, Haidian District, Beijing
Platinum (Beijing) Technology Co., Ltd
emkete@emcrafts.com.cn
Building 25, No. 9 Anningzhuang West Road, Haidian District, Beijing
Leica DM 4M upright metallographic microscope, a research grade semi-automatic intelligent digital upright metallographic microscope, is suitable for observation and analysis of samples such as metals, ceramics, polymer materials, electronic components, dust particles, etc. It has a modular design and can achieve reflection observation, reflection observation configuration, and color correction optical path. The overall optical path supports a 25 mm field of view diameter and a 6-hole objective disc, matched with a 32mm diameter industrial objective lens.
·Observation methods can achieve bright field, dark field, polarization, and interference
·High brightness and ultra long lifespan LED transparent and reflective lighting power supply, intelligent light intensity control lighting method,
·Capable of automatically remembering the combination of light intensity, aperture size, and condenser lens under different objective lenses and observation modes, automatically restoring them to their original positions, with simple and fast operation
·The machine base is equipped with an LCD display screen to show the working status and parameters of each component of the microscope
·The adjustment of light intensity, aperture, observation mode, and spotlight can be controlled not only by buttons, but also by computers
·Automatically add corresponding magnification scales to photos taken under different magnification objectives
·Equipped with a constant color temperature system to improve work efficiency
·Can be equipped with cameras and digital cameras for image acquisition, analysis, and measurement.
·Can be equipped with fluorescence observation, high-temperature hot table, cathodoluminescence analyzer, photometer
·Can be connected to 4x4, 6x6 large sample tables for observing large-sized samples such as silicon wafers
·Can be paired with an automatic scanning table for multi field analysis of non-metallic inclusions, particle size, and cleanliness