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KSI V450E ultrasonic scanning microscope can measure layered voids

NegotiableUpdate on 01/16

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Overview

KSI V450E ultrasonic scanning microscope can measure layered cavities and multi-layer measurable scanning acoustic microscope, also known as ultrasonic scanning microscope, is used to detect internal layering, cavities, cracks and other defects of various devices. KSI V450E ultrasonic scanning microscope can measure layered cavities

Product Details

KSI V450E ultrasonic scanning microscope can measure layered voids
KSI V450E ultrasonic scanning microscope can measure layered voids
Scanning acoustic microscope

Scanning Acoustic Microscope, also known as Ultrasonic Scanning Microscope, is used to detect internal delamination, voids, cracks, and other defects in various devices.

KSI v300E high-precision scanning acoustic microscope

1) Scanning mechanical mechanism

(1) XTheYThe shafts are driven by high-precision magnetic levitation linear motors

(2) XTheYMaximum scanning stroke range of the axis: 300mm × 300mm

(3) XTheYaxisMinimum scanning stroke range: 0.2mm × 0.2mm

(4) Maximum scanning rate:2000mm/sMaximum scanning acceleration30m/s²

(5) XTheYAxis scanning repeatability accuracy ±0.1um

(6) ZThe shaft is a high-precision self-locking stepper motor, with a maximum stroke of:100mm

(7) ZRepetitive accuracy of shaft motor: ± 0.25Mm

2) scanning mode

(1) Point waveform(A-Scan)

(2) Longitudinal section scan(B-Scan)

(3) Transverse scan(C-Scan)

(5) Equidistant multi-layer cross-sectional scanning(X-Scan)

(6) Custom multi-layer cross-sectional scanning, capable of independently setting parameters such as thickness for different layers

(7) Transmission scanning

(8) Sequential scanning, tray scanning, high-quality scanning, surface tracking scanning, holographic scanning (solid scanning)

(9) other

3) Pulse signal transceiver and transducer

(1) Scanning working mode: Single channel working mode

(2) Pulse signal transceiver bandwidth:5MHz～550MHz

(3) Total gain:150dB

4) Main functions

(1) Test internal defects of the tested workpiece, such as voids, delamination, cracks, foreign objects, etc;

(2) Scan image template function, easily obtain acoustic microscopy images with consistent parameters;

5) Other indicators

(1) Save image format:JPGTheBMP、TIFF、SAM；

(2) Maximum image sampling pixels:32000×32000pixel You can customize the input image resolution or individual pixel size, and the device will automatically calculate the image resolution used

6) Configuration and Attachment List

(1) KSI v300Ehost 1Taiwan

(2) Probe: According to actual needs, you can freely choose to share200Multiple probes

① 15MHzProbe;

② 30MHz probe；

③Other agreements200Multiple probe models;

(3) computer system 1set

⑦IntelCoREi5Multi-core processor

⑧128GBsolid-state drive+1000GBmechanical hard drive

⑨16GBmemory

⑩2a27Inch monitor

11 genuineMicrosoft windows 10Operating system (built-in to computer)

12 Keyboard and Mouse

13 Ksi visionHost control scanning software

14 Remote maintenance software

(4) The remaining components of the instrument are as follows

①Motor driver 3One;

②Ultrasonic signal generator and receiver 1One;

③大理石防震平台；

④Ultrasonic signal preamplifier 1One;

⑤sink 1a

⑥Automatic drainage outlet 1a

⑦Dry cloth 1article

(5) Accessories, consumables, and vulnerable parts:

①Random attachments: user manual, etc

②allCable andProbes are all vulnerable parts,1monthIf not damaged by human factors, it can be replaced.

KSI v450E Large Ultra High Resolution Ultrasonic Non Destructive Testing Instrument

KSI V450E 超声波扫描显微镜可测分层空洞

The all new KSI v450EScanning Acoustic Microscope for DBCboard, IGBT module, solar panel, multi waferand otherlarge sample inspections.The newv450Ecombines KSI’s unmatchedhigh speed scanningand unique vibration decoupling granite design with anextra large scanning range of 450mm x 450mm.With theKSI v450E easy handlingandfast evaluationoflarge size samplesis guaranteed.

The KSI v450E Key-Features:

• Extra large 450mm x 450mm scan field for DBC substrate / IGBT module / PCB

• Extra thickened marble base and deepened water tank make it easier to full auto- and semi auto- the testing of DBC substrates and IGBT modules

• New Highly Ergonomic, User-friendly Design with Wide Cover Opening for Easy Large Size Sample Handling

• Perfectly suitable for large sample inspections including DBC, IGBT, PCB boards, solar panel, multi wafer and all other large size and standard applications

Simultaneous Multi JEDEC Tray Scanningfor all standard.

• All-in-oneScanning Acoustic Microscope for inspection of PCB, multiple jedec, flip chip, stacked DIE, DBC, IGBT, multi wafer, MLCC, solar cells, and other semiconductor as well as material science applications

• Matchless vibration decoupling granite designand high speed linear drive with max. movingspeed 2,000 mm/s, and maximumacceleration 30,000 mm/s²

• Unique FCT™ (Fluid Cut Technology) Transducer

Available options:

• Customer Specific Tray Fixture for all Applications (wafer, jedec, BGA‘s, DBC, IGBT, Flip Chip etc.)

• Constant Coupling Liquid QualitywithDI-Water Refill UnitandWater Purity Control

• EliminationofContaminations and Gas Bubbles in Coupling LiquidforHighest Picture Quality and Stable Scan-Process

• AutomationofSample Positioning, Scan Process, Failure Detection, Analysis & Quantification

IP-holding GmbH, Walther-Rathenau-Str.18, 35745, Herborn, Germany.

KSI V-quattro four probe ultrasonic scanning microscope system

Multipurpose System -4-probe Ultrasonic Scanning Microscope Analysis System

Four probe system, using four transducers simultaneously
-Maximum scanning speed: 2000 mm/s
-Compared to other brands, the scanning efficiency is 30% higher
-Maximum scanning range: 1000mm × 700mm
-Minimum scanning range: 200 μ m × 200 μ m
-Bandwidth: 550MHz
-Maximum magnification: 250 times
-New FCT transducer

KSI V-duo Dual Probe Ultrasonic Scanning Microscope System

Dual probe ultrasonic scanning microscope system, using 2 transducers simultaneously
-Maximum scanning speed: 2000 mm/s
-Compared to other brands, the scanning efficiency is 30% higher
-Maximum scanning range: 700mm × 600mm
-Minimum scanning range: 200 μ m × 200 μ m
-Bandwidth: 550MHz
-Maximum magnification: 625 times
-New type of transducer

KSI V-Octo Eight Probe Large Ultrasonic Scanning Microscope System

Large 8-probe ultrasonic scanning microscope analysis system

The system uses 8 transducers simultaneously, ensuring fast image acquisition and high efficiency to the maximum extent possible.
-Maximum scanning speed: 2000 mm/s
-Compared to other brands, the scanning efficiency is 30% higher
-Maximum scanning range: 1000mm × 700mm
-Minimum scanning range: 200 μ m × 200 μ m
-Bandwidth: 550MHz
-Maximum magnification: 250 times
-New type of transducer