Jupiter Discovery Atomic Force Microscope

innovation AFM technology, large sample detection performance

lUltra high resolution imaging

lHigh throughput imaging

Optimize workflow and enhance user experience

lPre installed probes

lTop view and lateral dual view CCD system

lintelligent FFM Topography Mode

Rich accessories and strong scalability

lMultiple accessories to choose from

lExpand more features

Innovative design conceptSignificantly improve vertical and horizontal resolution

lAdopting optimized structural designEffectively improve system stiffness and reduce thermal drift effects, with noise levels below 25 pm.

lEquipped with excellent facilities LVDT position sensing technology significantly reduces system noise and maintains long-term stable high-resolution measurements, reducing the need for repeated calibration.

Obtain higher testing efficiency

lAdopting optimized electronic and mechanical bandwidth designThe scanning speed has been significantly improved compared to conventional large sample atomic force microscopes, while maintaining compatibility with various working modes and accessories.

lThe high-speed scanning function not only shortens the image acquisition timeIt also expands the application methods. This feature supports large-scale sample detection while maintaining high resolution, and can achieve complete characterization of larger samples through multi area stitching technology.

Simplified workflow

lAdopting pre installed probe designSimplify the probe replacement process.

lFully automated settings significantly reduce manual operation stepsSimply click the mouse to complete parameter optimization.

lEquipped with a multi angle optical observation systemIncluding two sets of CCD systems for side view observation and high-definition top view, it helps to quickly locate the detection area.

Easy to operateHigh usability

lIntelligent workflowAutomatically optimize parameter settings and data collection

lAll operating modes follow a unified design philosophy and guide users through automated processes to complete configurations. The system achieves full process automation within the technically feasible range, and for links that require manual interventionProvide detailed operational assistance to ensure that the operator completes the operation smoothly.

AutoPilot intelligent algorithm improves operational efficiency

lThe AutoPolit feature focuses on optimizing the basic imaging of the tap mode and the new FFM Topography mode, while other advanced modes have also been greatly simplified. Even more advanced modes such as Conductive Atomic Force Microscopy (CAFM), Kelvin Probe Microscopy (KPFM), Piezoelectric Force Microscopy (PFM), and Scanning Capacitive Microscopy (SCM) can now be easily used without extensive experience.

Automated multi-point repeatability detection process

lAutomated testing module, supporting users to configure differentiated scanning schemes at preset sample coordinate positions, suitable for industrial quality inspection field(QA/QC), Including quality monitoring of wafer surface deposition/etching processes and analysis of surface morphology characteristics. Simultaneously supporting the automation of repetitive experimental processes in scientific research scenarios, coupled with high-speed scanning technology, it can be extended to systematic detection of large-sized samples.