Hitachi S-3700N Scanning Electron Microscope

NegotiableUpdate on 02/10

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Overview

Hitachi S-3700N Scanning Electron Microscope

Product Details

Product Introduction
Scanning electron microscopy (SEM) has now been extended to a wide range of enterprises and institutions, not only in academic research fields, but also in various industries. Correspondingly, the types of samples that users need to observe and analyze have also expanded. The development of S-3700N fully considers the diverse application needs mentioned above. The standard configuration of this product includes a secondary electron detector, a five segment segmented backscattered electron (BSE) detector, and a variable pressure (VP) mode.
This allows for the observation of the vast majority of samples without the traditional metal spraying required by scanning electron microscopy, allowing for direct observation of water containing samples in their natural state.
The S-3700N has a huge sample chamber that can accommodate samples up to 300 mm in diameter and 110 mm in height. The sample room is equipped with various accessory ports that can meet the extremely wide application needs of electron microscopy today. These accessories include EDX, WDX, EBSD, sample room monitoring device, cold stage, etc. The versatility and flexible system configuration of this product can well meet your current and future needs.
Product Features
The extra large sample chamber can accommodate samples with a maximum diameter of 300 mm and can also be equipped with accessories such as EDX/WDX/EBSD. It can carry samples up to a height of 110 mm.
The 5-axis motor drives the optimal center tilt, rotation, image navigation system, sample stage tracking, trajectory storage, and center reset motor control functions of the sample stage.
The S-4800, SU-70, and S-3400N all have user-friendly GUI designs, which allow operators to operate with simple training.
The display system has excellent performance such as full screen display, flicker free, high pixel and real-time image display. It can also mix real-time signals and display different sample information observed by two different detectors simultaneously.
Variable voltage mode does not require metal spraying and allows direct observation of non-conductive samples.
High sensitivity semiconductor backscattered electron detectors can operate in fast scanning mode, making it easier and more convenient to find regions of interest in large-sized samples.
The standard equipment includes a turbo molecular pump (TMP), which minimizes sample contamination due to its clean and dry vacuum conditions. Different from traditional diffusion pump scanning electron microscopes, this product does not require a large heating power or circulating water tank, making it an energy-saving and eco-friendly scanning electron microscope.