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FEI Scanning Electron Microscope Apreo Materials Science Applications

NegotiableUpdate on 02/10
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FEI Scanning Electron Microscope Apreo Materials Science Applications
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Apreo Materials Science Applications

The most feature rich high-performance SEM


Apreo's revolutionary composite lens design combines electrostatic and magnetic immersion technology, resulting in unprecedented high resolution and signal selection. This makes Apreo an ideal platform for studying nanoparticles, catalysts, powders, and nanodevices without compromising the performance of magnetic samples.

Apreo benefits from its unique in lens backscatter detection, which provides excellent material contrast even when tilted, at short working distances, or used for sensitive samples. The new composite lens further improves contrast and increases charge filtering for imaging insulating samples through energy filtering. The optional low vacuum mode now has a maximum sample chamber pressure of 500 Pa, which can image the most demanding insulators.

Through these advantages, including composite final lenses, advanced detection, and flexible sample processing, Apreo can provide outstanding performance and versatility to help you tackle future research challenges.



Experience the advantages brought by Apreo SEM

  • The unique composite final lens can provide excellent resolution (1.0 nm at 1 kV voltage) on any sample, even when tilted or conducting terrain measurements, without the need for electron beam deceleration.
  • Highly effective backscatter detection - always ensuring good material contrast, even when imaging electron beam sensitive samples at TV rate with low voltage and electron beam current at any tilt angle.
  • Extremely flexible detector - can combine the information provided by various detector parts to obtain crucial contrast or signal strength.
  • Various charge mitigation strategies, including a low vacuum mode with a sample chamber pressure of up to 500 Pa, can achieve imaging of any sample.
  • Excellent analysis platform provides high electron beam current and small spot size. The sample chamber supports three EDS detectors, coplanar EDS and EBSD, and a low vacuum system optimized for analysis.
  • Sample processing and navigation are extremely simple, with a multi-purpose sample holder and Nav Cam+.
  • Provide expert level results for new users through advanced user guidance, preset, and undo functions.