Emission spectrum XES

Emission spectroscopy (XES) is an important analytical technique primarily used to study the electronic structure and chemical properties of materials. Hard X-rays have high energy and can penetrate deep into the interior of samples, making XES a powerful tool for detecting deep information in materials.

For a long time, X-ray absorption fine structure spectroscopy (XAFS) has only been tested on various synchrotron radiation sources. Due to the limited time of the light source machine, it cannot meet the testing needs of many researchers. In recent years, XAFS data has become a standard feature for top journals, leading to an increasing number of research groups requiring XAFS testing. Adhering to the concept of letting XAFS enter every laboratory, the Institute of High Energy Physics of the Chinese Academy of Sciences and the University of Science and Technology of China jointly launched a new X-ray absorption fine structure spectrometer (RapidXAFS).

Emission spectrum XESProduct advantages:

Has the following characteristics:

• Highest luminous flux product

  Photon flux higher than 1000000 photons/second/eV -4000000 photons/second/eV, with spectral efficiency several times higher than other products; Obtain data quality equivalent to synchrotron radiation

• Excellent stability

  The stability of monochromatic light intensity of the light source is better than 0.1%, and the energy drift during repeated collection is less than 50 meV

• <1% detection limit

  High luminous flux, excellent optical path optimization, and light source stability ensure high-quality EXAFS data even when the measured element content is>1%

• Double Roland circular structure

  Breakthrough use of double Roland circle structure to simultaneously characterize the local structures of two elements under one X-ray source
  

X-ray absorption fine structure (XAFS) is a powerful tool for studying the local atomic or electronic structure of materials, widely used in popular fields such as catalysis, energy, and nanotechnology.

Emission spectrum XESThe main advantages are as follows:

1. Not dependent on long-range ordered structures, it can be used for the study of amorphous materials;

2. Without interference from other elements, different elements in the same material can be studied separately;

3. No damage to the sample, tested in atmospheric environment, can be tested in situ;

4. Not affected by the sample state, it can measure solids (crystals, powders), liquids (solutions, molten states), gases, etc;

5. It can obtain structural parameters such as coordination atom type, coordination number, and atomic spacing, with an atomic spacing accuracy of up to 0.01A.

Design of Double Roland Circle Structure

Can rival the resolution of synchrotron radiation

XES testing can distinguish between N, C, and O

The XAFS spectrum mainly consists of two parts: X-ray absorption near edge structure (XANES) and extended X-ray absorption fine structure (EXAFS). The energy range of EXAFS is approximately 50 eV to 1000 eV behind the absorption edge, which is the result of the single electron single scattering effect of the inner layer photoelectrons excited by X-rays between the surrounding atoms and the absorbing atoms. XANES includes a range of about 10 eV before the absorption edge to about 50 eV after the absorption edge, mainly derived from the single electron multiple scattering effect of inner shell photoelectrons excited by X-rays between surrounding atoms and absorbing atoms.

Measurable elements: The green part can measure the K side, and the yellow part can measure the L side

XAFS application:

• Industrial Catalysis

• Energy storage materials

• nanomaterials

• environmental toxicology

• Qualitative analysis

• Heavy element analysis