Electronic component inspection microscope

NegotiableUpdate on 05/06

Model

Nature of the Manufacturer: Producers

Product Category

Place of Origin

Online Consult

Overview

Electronic component inspection microscope $r $n magnification: optical 800 times magnification, electronic 8000 times magnification $r $n pixels: 2 million pixels uncompressed $r $n output resolution: 1920 * 1080 P $r $n output method: HDMI high-definition screen connection $r $n functions: 2K high-definition image photography/measurement/recording/playback/saving, data export, template preset, CAD template import Application areas: semiconductor chip industry, metal surface analysis, chip whole board observation

Product Details

Electronic component inspection microscopeMagnification: Optical 800 times magnification, electronic 8000 times magnification

Pixel: 2 million pixels without compression

Output resolution: 1920 * 1080P

Output method: HDMI high-definition screen connection

Function: 2K high-definition image photography/measurement/recording/playback/saving, data export, template preset, CAD template import ..

Application areas: semiconductor chip industry, metal surface analysis, chip whole board observation

XJP-302/302BD upright metallographic microscope is suitable for microscopic observation of opaque objects. By adopting an excellent infinite optical system and modular functional design concept, the system can be easily upgraded to achieve polarization observation, dark field observation, and other functions. The compact and stable high rigidity body fully reflects the anti vibration requirements of microscopic operations. Ideal design that meets ergonomic requirements, making operation more convenient, comfortable, and spacious. Suitable for microscopic observation of metallographic structure and surface morphology, it is an instrument for research in metallurgy, mineralogy, and precision engineering.

电子元件检查显微镜

Electronic component inspection microscopeTechnical specifications:

eyepiece	Large field of view WF10X (field of view size Φ 22mm)
Infinite flat field achromatic objective lens	XJP-302 (Equipped with field objective lens)		PL L5X/0.12 working distance: 26.1 mm
			PL L10X/0.25 working distance: 20.2 mm
			PL L20X/0.40 working distance: 8.80 mm
			PL L50X/0.70 working distance: 3.68 mm
			PL L80X/0.80 working distance: 1.25 mm
	XJP-302BD (Equipped with bright/dark field objective lens)		PL L5X/0.12 BD working distance: 8.05mm
			PL L10X/0.25 BD working distance: 7.86mm
			PL L20X/0.40 BD working distance: 7.23mm
			PL L50X/0.70 BD working distance: 1.75mm
			PL L80X/0.80 BD working distance: 0.80mm
Eyepiece tube	Triple eyepiece tilted at 30 degrees, capable of 100% light transmission photography
Falling light illumination system	XJP-302	12V30W halogen lamp, adjustable brightness
	XJP-302BD	12V50W halogen lamp, adjustable brightness
	Built in field of view light bar, aperture light bar, (yellow, blue, green, frosted glass) color filter conversion device, push-pull analyzer and polarizer
focusing system	Coarse micro coaxial focusing with locking and limiting devices, micro grid value: 0.7 μ m
transformer	Five holes (inward ball positioning)
stage	Mechanical stage, external dimensions: 280mmX270mm, movement range: horizontal (X) 204mm, vertical (Y) 204mm

Optional accessories:

name	Category/Technical Parameters		remark
eyepiece	Divide into 10X (Φ 22mm) grids with a grid value of 0.1mm per grid
objective lens	PL L40X/0.60 working distance: 3.98	Bright field of view
	PL L60X/0.70 working distance 2.08mm
	PL L100X (dry)/0.85 working distance 0.4mm
	PL L40X/0.60 BD working distance 3.0mm	Bright and dark fields of view
	PL L60X/0.70 BD working distance 1.65mm
	PL L100X/0.85 BD working distance 0.4mm