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Deresheke (Langfang) Technology Co., Ltd
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Deresheke (Langfang) Technology Co., Ltd

  • E-mail

    qianjuan@laserdl.cn

  • Phone

    13451510854

  • Address

    Building A1, Phase 1.1, Intelligent Manufacturing Industrial Park, Dachang Hui Autonomous County, Langfang City, Hebei Province

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EL tester

NegotiableUpdate on 02/09
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Overview
The EL tester can obtain testing parameters such as I-V curve, P-V curve, irradiance curve, short-circuit current, open circuit voltage, peak power, peak power point voltage and current, constant voltage point current, fill factor, conversion efficiency, series resistance, parallel resistance, etc.
Product Details
EL tester structure composition and product features:
1. The EL tester consists of a light source control system, power control system, testing system, constant temperature system, infrared temperature probe, reference battery, computer, display, etc.
2. It can achieve standard I-V and V-I scanning, with various testing technologies such as MPPT (Maximum Power Point Tracking) and I-t (Constant Voltage).
3. The device can obtain testing parameters such as I-V curve, P-V curve, irradiance curve, short-circuit current, open circuit voltage, peak power, peak power point voltage and current, constant voltage point current, filling factor, conversion efficiency, series resistance, parallel resistance, etc.
4. Combine different types of LED beads as a steady-state light source, with each type of bead independently adjustable, suitable for IV testing of crystalline silicon, perovskite, and stacked cells and their corresponding components.

EL tester parameters:
Adaptation standards IEC60904-9:2020
Light source type LED combination light source, individually adjustable for each wavelength band
cooling method 定制水冷
light source lifetime 40000h
spectral range 350-1150nm, Customizable UV and IR
Light source grade Spectral matching degree 0.875-1.125 A+; non-uniformity of irradiance ≤1% A+; irradiance instability ≤1% A+
Range of irradiance 200W/㎡~1200W/㎡
Test area 300*300mm  Customizable in other sizes
test mode In steady-state testing mode, it can be freely set from 1 second to continuous lighting, compatible with transient testing mode
Multi channel design 36 channels can be tested simultaneously, and the number of channels can be customized
Testing Technology Equipped with I-V and V-I scanning modes as standard, it has multiple testing technologies such as MPPT (Maximum Power Point Tracking) and I-t (Constant Voltage), which can be switched through software. At the same time, it integrates point by point scanning mode (meeting the scanning mode with a minimum step time of ≤ 0.2s)
Test battery type Polycrystalline, monocrystalline Topcon、BC、 Heterojunction CIGS、GaAs、CdTe、 Perovskite, perovskite stack, etc
Additional items that can be added 1. Customizable 0BB testing fixtures and perovskite adaptation fixtures; 2. Integrate temperature control system to achieve temperature coefficient testing; 3. Glove box (Mikolana)