EL tester

NegotiableUpdate on 02/09

Model

Nature of the Manufacturer: Producers

Product Category

Place of Origin

Online Consult

Overview

The EL tester can obtain testing parameters such as I-V curve, P-V curve, irradiance curve, short-circuit current, open circuit voltage, peak power, peak power point voltage and current, constant voltage point current, fill factor, conversion efficiency, series resistance, parallel resistance, etc.

Product Details

EL tester structure composition and product features:
1. The EL tester consists of a light source control system, power control system, testing system, constant temperature system, infrared temperature probe, reference battery, computer, display, etc.
2. It can achieve standard I-V and V-I scanning, with various testing technologies such as MPPT (Maximum Power Point Tracking) and I-t (Constant Voltage).
3. The device can obtain testing parameters such as I-V curve, P-V curve, irradiance curve, short-circuit current, open circuit voltage, peak power, peak power point voltage and current, constant voltage point current, filling factor, conversion efficiency, series resistance, parallel resistance, etc.
4. Combine different types of LED beads as a steady-state light source, with each type of bead independently adjustable, suitable for IV testing of crystalline silicon, perovskite, and stacked cells and their corresponding components.

EL tester parameters:

Adaptation standards	IEC60904-9:2020
Light source type	LED combination light source, individually adjustable for each wavelength band
cooling method	定制水冷
light source lifetime	40000h
spectral range	350-1150nm， Customizable UV and IR
Light source grade	Spectral matching degree 0.875-1.125 A+; non-uniformity of irradiance ≤1% A+; irradiance instability ≤1% A+




Range of irradiance	200W/㎡~1200W/㎡
Test area	 300*300mm  Customizable in other sizes
test mode	In steady-state testing mode, it can be freely set from 1 second to continuous lighting, compatible with transient testing mode
Multi channel design	36 channels can be tested simultaneously, and the number of channels can be customized
Testing Technology	Equipped with I-V and V-I scanning modes as standard, it has multiple testing technologies such as MPPT (Maximum Power Point Tracking) and I-t (Constant Voltage), which can be switched through software. At the same time, it integrates point by point scanning mode (meeting the scanning mode with a minimum step time of ≤ 0.2s)
Test battery type	Polycrystalline, monocrystalline Topcon、BC、 Heterojunction CIGS、GaAs、CdTe、 Perovskite, perovskite stack, etc
Additional items that can be added	1. Customizable 0BB testing fixtures and perovskite adaptation fixtures; 2. Integrate temperature control system to achieve temperature coefficient testing; 3. Glove box (Mikolana)