EBSD electron backscatter diffractometer

Fiber optic coupling brings high sensitivity

Oxford Instruments CMOS EBSD adopts a fiber coupled optical system, and the incoming light is not limited by the lens aperture. Compared to traditional lens coupling, it greatly improves the sensitivity of the detector and can even be used for EBSD acquisition of sensitive materials such as perovskite organic compounds.

High temperature fluorescent screen optional

New generation high-temperature fluorescent screenUsing infrared optical filter technology, it can effectively filter the infrared background caused by high temperature and preserve the pattern signal.

Omnipotent type EBSD detector

The SymmetryS3 electron backscatter diffraction detector is the third generation detector in the versatile Symmetry product series. S3 combines high-speed analysis (>5700 patterns/second) with various excellent features to ensure superior performance and meet the needs of scientific research in various fields.

The SymmetryS3 is an EBSD detector designed to provide excellent results from various types of samples. The lensless fiber coupled camera system can achieve excellent sensitivity under all analysis conditions, from the analysis of flow sensitive materials to high-speed characterization of conventional samples. The combination of high pixel resolution and guaranteed sub-pixel pattern distortion level makes S3 an ideal choice for strain analysis and high-precision EBSD work. The software controlled tilt function of the detector ensures that samples of each size and shape can be collected at optimized geometric positions.

6 camera modes, suitable for daily and high difficulty analysis of pattern images up to 1244x1024 pixels, with a resolution acquisition speed of>5700 patterns/second and a resolution of 156x128 pixels

Fluorescence screen lifting control for Symmetry S3. No matter the size or height of the sample, the front end of the detector can always maintain the optimal collection position

High-resolution type EBSD detector

C-Nano+is an excellent CMOS EBSD detector that provides EBSD patterns with a resolution of millions of pixels and ensures an analysis speed of over 600 patterns per second.

This, coupled with the high sensitivity brought by its fiber optic system, makes C-Nano+is an ideal choice for high-precision analysis of challenging materials, including ceramics and minerals.

megapixel 1244x1024 resolution pattern, with a simultaneous acquisition speed of 80 patterns/second: very suitable for HR-EBSD research and detailed strain analysis and phase identification. The maximum analysis speed reaches 600 patterns/second, with a resolution of 312x256 pixels and only 3 nA beam current (on steel and Ni)

new generation EBSD data processing software

Standard ConfigurationMeet your regular EBSD data analysis needs

most EBSD data analysis requires conventional data processing, such as drawing various surface distribution maps, calculating grain size, analyzing texture, viewing grain boundaries, studying strain, etc. AZtecCrystal standard configuration provides powerful and convenient tools to meet your diverse data processing needs. The processing speed of AZtecCrystal has been greatly improved, making it very suitable for handling big data collected by high-speed CMOS EBSD detectors. Whether you are a beginner or an expert, you can handle it with ease!

lexceed 30 types of surface distribution maps, customizable with unlimited combinations for real-time measurement of grain size, meeting ISO and ASTM standards, providing over 30 grain parameters

lComplete texture analysis, including polar plot, antipolar plot, and orientation distribution function

lComprehensive analysis of grain boundaries, including orientation difference analysis and detailed statistical table of grain boundary length

lCorrelation analysis with electronic imagesDistortion of the school front distribution map