E4980BL American KEYSIGHT is a German LCR bridge

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E4980BL American KEYSIGHT is a German LCR bridge

E4980BL 20Hz to 300 kHz with DC resistance (DCR)

E4980BL 20Hz to 300kHz, with DC resistance (DCR) measurement function and processor interface

E4980BL 20Hz to 500 kHz with DC resistance (DCR)

E4980BL 20Hz to 1 MHz with DC resistance (DCR)

E4980B 20Hz to 2 MHz with DC resistance (DCR)

Frequency range of 20 Hz to 300 kHz/500 kHz/1 MHz, with four bit resolution in any range

A basic accuracy of 0.05%, with excellent measurement repeatability under both low impedance and high impedance conditions

100 microvolts to 2 volts root mean square; Variable test signal from 1 microampere to 20 milliampere

DC bias voltage of 1.5/2 V

Automatic level control

DC resistance

201 point list measurement scan

Multi functional PC connection (LAN, USB, and GPIB)

Frequency upgradability

The E4980BL precision LCR meter from Shide Technology is an industry standard LCR measuring instrument that combines accuracy, speed, and versatility, suitable for a wide range of component measurements. Its optional frequency upgrade scheme provides users with powerful investment choices and asset utilization improvement solutions.

E4980BL is suitable for routine research and manufacturing testing of components and materials, providing fast measurement speed and excellent performance in both low impedance and high impedance ranges.

Multi functional LAN, USB, and GPIB PC connectivity can enhance your design and testing efficiency. In terms of material measurement, the E4980BL can be used in conjunction with the Sid N1500A-005/006 material measurement kit to simplify the entire process from fixture setup to report generation.

measurement parameters

– Cp-D、 Cp-Q、 Cp-G、 Cp-Rp

– Cs-D、 Cs-Q、 Cs-Rs

– Lp-D、 Lp-Q、 Lp-G、 Lp-Rp、 Lp-Rdc

– Ls-D、 Ls-Q、 Ls-Rs、 Ls-Rdc

– R-X

– Z-qd、 Z-qr

– G-B

– Y-qd、 Y-qr

– Vdc-Idc1

definition

Cp capacitance value measured through parallel equivalent circuit model

The capacitance value measured by Cs through a series equivalent circuit model

Lp inductance value measured through parallel equivalent circuit model

The inductance value measured by Ls through a series equivalent circuit model

D loss factor

Q quality factor (reciprocal of D)

Equivalent parallel conductance measured by G through parallel equivalent circuit model

Rp is the equivalent parallel resistance measured through a parallel equivalent circuit model

Equivalent series resistance measured by Rs through a series equivalent circuit model

Rdc DC resistor

R resistor

X reactance

Z impedance

Y admittance

QD impedance/admittance phase angle (angle)

QR impedance/admittance phase angle (radians)

B Electric Nano

Vdc DC voltage

Idc DC current

Deviation measurement function: Reference value deviation and reference value deviation percentage can be output as results.

Measure equivalent circuit: parallel, series

Impedance range selection: automatic (automatic range mode), manual (maintain range mode)

Trigger modes: internal trigger (INT), manual trigger (MAN), external trigger (EXT), GPIB trigger (BUS)

E4980BL American KEYSIGHT is a German LCR bridgeBasic technical indicators

1. Trigger delay range: 0 s -999 s

Resolution of 100 µ s (0-100 s)

1 ms (100 s - 999 s)

Table 2 Step delay

Range 0 s -999 s

Resolution of 100 µ s (0-100 s)

1 ms (100 s - 999 s)

Measurement terminals: four terminal pair

Test cable length: 0 m, 1 m, 2 m, 4 m

Measurement time modes: Short duration (SHORT) mode, Medium duration (MED) mode, Long duration (LONG) mode.

Table 3 average

Range 1-256 measurements

Resolution 1

test signal

Table 4 test frequency

Test frequency 20 Hz -2 MHz (E4980B)

20 Hz - 1 MHz (E4980BL-102)

20 Hz - 500 kHz (E4980BL-052)

20 Hz - 300 kHz (E4980BL-032)

Resolution 0.01 Hz (20 Hz -99.99 Hz)

0.1 Hz (100 Hz - 999.9 Hz)

1 Hz (1 kHz - 9.999 kHz)

10 Hz (10 kHz - 99.99 kHz)

100 Hz (100 kHz - 999.9 kHz)

1 kHz (1 MHz - 2 MHz)

Measurement accuracy ± 0.01%

Table 5 Test signal mode

Normally, when measuring open or short circuits in terminals, the program selects the voltage or current respectively.

Maintain a selected voltage or current on the tested device regardless of changes in impedance.

Table 6 Test signal voltage

Range 0 Vrms -2.0 Vrms

分辨率 100 µVrms (0 Vrms - 0.2 Vrms)

200 µVrms (0.2 Vrms - 0.5 Vrms)

500 µVrms (0.5 Vrms - 1 Vrms)

1 mVrms (1 Vrms - 2 Vrms)

Precision standard ± (10%+1 mVrms) Test frequency ≤ 1 MHz: Technical specifications

Test frequency>1 MHz: typical value

Constant 1 ± (6%+1 mVrms) Test frequency ≤ 1 MHz: Technical specifications

Test frequency>1 MHz: typical value

Table 7 Test signal current

Range 0 Arms -20 mArms

Resolution 1 µ Arms (0 Arms -2 mArms)

2 µArms (2 mArms - 5 mArms)

5 µArms (5 mArms - 10 mArms)

10 µArms (10 mArms - 20 mArms)

Precision routine ± (10%+10 µ Arms) testing frequency ≤ 1 MHz: Technical specifications

Test frequency>1 MHz: typical value

Constant 1 ± (6%+10 µ Arms) test frequency ≤ 1 MHz: Technical specifications

Test frequency>1 MHz: typical value

Output impedance: 100 Ω (nominal value)

Test signal level monitoring function

- Can monitor the voltage and current of the test signal.

- Level monitoring accuracy:

Table 8 Test signal voltage monitoring accuracy (Vac)

Test signal voltage 2, test frequency technical indicators

5 mVrms -2 Vrms ≤ 1 MHz ± (3% of reading+0.5 mVrms)

>1 MHz ± (6% of reading+1 mVrms)

Table 9 Test signal current monitoring accuracy (lac)

Test signal current 2, test frequency technical indicators

50 µArms - 20 mArms ≤ 1 MHz

> 1 MHz

± (3% of reading+5 µ Arms)

± (6% of reading+10 µ Arms)

When the automatic level control function is turned on.

2. This is not the output value, but the displayed test signal level.

Table 10 lists the range of measurement values that can be displayed on the screen. For the effective measurement range, refer to the impedance in Figure 1

Example of measurement accuracy.

Table 10 Permitted measurement value display range

Parameter measurement display range

Cs, Cp ± 1.000000 aF to 999.9999 EF

Ls, Lp ± 1.000000 aH to 999.9999 EH

D ± 0.000001 to 9.999999

Q ± 0.01 to 99999.99

R. Rs, Rp, X, Z, Rdc ± 1.000000 a Ω to 999.9999 E Ω

G. B. Y ± 1000000 aS to 999.9999 ES

Vdc ±1,000000 aV to 999.9999 EV

Idc ±1.000000 aA 至 999.9999 EA

Qr ± 1000000 arad to 3.141593 rad

qd ±0.0001 deg 至 180.0000 deg

∆% ± 0.0001% to 999.9999%

a： 1 x 10-18、 E: 1 x 1018

Absolute measurement accuracy

The absolute accuracy is calculated using the following equation.

|The absolute accuracy Aa of Z |, | Y |, L, C, R, X, G, and B (when Dx ≤ 0.1, the accuracy of L, C, X, and B is appropriate)

When Qx ≤ 0.1, R and G accuracy are applicable

When Dx ≥ 0.1, multiply Acal by √ 1+D2x to obtain the precision of L, C, X, and B

When Qx ≥ 0.1, multiply Acal by √ 1+Q2x to obtain R and G precision

In an alternating magnetic field, the following equation can be used to calculate measurement accuracy.

A x (1 + B x ( 2 + 0.5 / Vs))

Among them, A has absolute accuracy

B magnetic induction intensity [Gauss]

Vs test signal voltage level [V]

Equation 1: Aa=Ae+Acal

Aa absolute accuracy (% of reading)

Ae relative accuracy (% of reading)

Acal calibration accuracy (%)

Among them, G accuracy is only applicable to G-B measurement.

D accuracy (when Dx ≤ 0.1)

Equation 2: De+qcal

The D value measured by Dx

Relative accuracy of De D

Calibration accuracy of QCAL Q (radians)

When 0.1<Dx ≤ 1, multiply qcal by (1+Dx)

Q accuracy (when Qx × Da<1)

Equation 3: (Qx2 × Da)

± ————————————

(1 ± Qx × Da)

The Q value measured by Qx

The absolute accuracy of Da D

Q accuracy

Equation 4: qe+qcal

Relative accuracy of qe q (angle)

Calibration accuracy (angle) G accuracy of QCAL Q (when Dx ≤ 0.1)

Equation 5: Bx+Da (S)

1

BX = 2 πfcx = —— ——

2πfLx

The D value measured by Dx

B value measured by Bx (S)

The absolute accuracy of Da D

Measurement frequency (Hz)

C value measured by Cx (F)

L value measured by Lx (H)

Among them, G precision is suitable for Cp-G measurement.

Absolute accuracy of Rp (when Dx ≤ 0.1)

Equation 6: Rpx × Da

±—————————(Ω)

Dx± Da

Rpx measured Rp value (Ω)

The D value measured by Dx

The absolute accuracy of Da D

Absolute accuracy of Rs (when Dx ≤ 0.1)

Equation 7:Xx × Da(Ω)

1

Xx = ——————= 2πfLx

2 πfcx

The D value measured by Dx

The X value measured by Xx (Ω)

The absolute accuracy of Da D

Test frequency (Hz)

C value measured by Cx (F)

L value measured by Lx (H)

When the calculation result is negative, apply 0 A.

relative accuracy

Relative accuracy includes stability, temperature coefficient, linearity, repeatability, and calibration interpolation error. Relative accuracy is defined when all of the following conditions are met:

Preheating time: 30 minutes

Test cable length: 0 m, 1 m, 2 m, or 4 m (Keysight 160486 A/D/E)

- No warning of 'signal source overload' displayed.

When the test signal current exceeds the values in Table 11 below, the LCR meter will display a "signal source overload" warning.

Table 11

Test signal voltage test frequency condition 1

≤ 2 Vrms – –

> 2 Vrms ≤ 1 MHz 110 mA 或 130 mA - 0.0015 × Vac × (Fm / 1 MHz) ×

(L_cable + 0.5)， Take the smaller value

> 1 MHz 70 mA - 0.0015 × Vac × (Fm / 1 MHz) × (L_cable + 0.5)

Vac [V] test signal voltage

Fm [Hz] test frequency

L_cable [m] cable length

- Open circuit and short circuit corrections have been performed.

- Bias current isolation: off

The DC bias current will not exceed the set value within each DC bias current range

- Select the optimal impedance range by matching the impedance of the tested device with the effective measurement range.

|Z |, | Y |, L, C, R, X, G, and B accuracies (when Dx ≤ 0.1, L, C, X, and B accuracies apply; When Qx ≤ 0.1, R and G accuracy apply

When Dx>0.1, multiply Ae by √ 1+D2x to obtain the precision of L, C, X, and B

When Qx>0.1, multiply Ae by √ 1+Q2x to obtain R and G accuracy

The relative accuracy Ae is calculated according to the following formula:

Equation 8: Ae=[Ab+Zs/| Zm | × 100+Yo × | Zm | × 100] × Kt

Zm measured device impedance

Ab basic accuracy

Zs short circuit bias

Yo open circuit bias

Kt temperature coefficient

D accuracy

When Dx ≤ 0.1, the precision De of D is calculated according to the following formula:

Equation 9: De=± Ae/100

The D value measured by Dx

Relative accuracy of Ae | Z |, | Y |, L, C, R, X, G, and B

When 0.1<Dx ≤ 1, multiply De by (1+Dx)

Q accuracy (when Q x De<1)

The Q accuracy Qe is calculated according to the following formula:

Equation 10: (Qx2 × De)

Qe = ± —————————————

(1± Qx × De)

The Q value measured by Qx

De relative to D accuracy

Q accuracy

Calculate the q accuracy θ e using the following formula:

Equation 11: 180 × Ae

qe = (deg)

π × 100

Relative accuracy of Ae | Z |, | Y |, L, C, R, X, G, and B

G accuracy (when Dx ≤ 0.1)

Calculate the G precision Ge according to the following formula:

Equation 12: Ge=Bx × De (S)

1

BX = 2 πfcx = —— ——

2πfLx

Ge G relative accuracy

The D value measured by Dx

B value measured by Bx

De D relative accuracy

Test frequency (Hz)

C value measured by Cx (F)

L value measured by Lx (H)

Rp accuracy (when Dx ≤ 0.1)

Rp accuracy Rpe is calculated according to the following formula:

Equation 13: Rpx × De(Ω)

Rpe = ± ———————————

Dx ± De

Rpe Rp relative accuracy

Rpx measured Rp value (Ω)

The D value measured by Dx

Relative accuracy of De D

Rs accuracy (when Dx ≤ 0.1)

The precision Rse of Rs is calculated according to the following formula:

Equation 14:Rse = Xx × De(Ω)

1

Xx = —————–—= 2πfLx

2 πfcx

Relative accuracy of Rse Rs

The D value measured by Dx

The X value measured by Xx (Ω)

Relative accuracy of De D

Test frequency (Hz)

C value measured by Cx (F)

L value measured by Lx (H)

C-D accuracy calculation example

Measurement conditions

Test frequency: 1 kHz

Measured C value: 100 nF

Test signal voltage: 1 Vrms

Measurement time mode: MED

Measurement temperature: 23 ° C

Ab = 0.05%

|Zm| = 1 / (2π × 1 × 103 × 100 × 10-9) = 1590 Ω

Zs = 0.6 m Ω × (1 + 0.400/1) × (1 + √(1000/1000) = 1.68 m Ω

Yo = 0.5 nS × (1 + 0.100/1) × (1 + √(100/1000) = 0.72 nS

C 精度： Ae = [0.05 + 1.68 m/1590 × 100 + 0.72 n × 1590 × 100] × 1 = 0.05%

D accuracy: De=0.05/100=0.0005

The effect of impedance of the tested device

Table 14 When the impedance of the tested device is below 30 Ω, add the following values.

Test frequency [Hz] Impedance of the tested device

1.08 Ω ≤ |Zx| < 30 Ω |Zx| < 1.08 Ω

20 - 1 M 0.05% 0.10%

1 M - 2 M 0.10% 0.20%

Table 15 When the impedance of the tested device is higher than 9.2 k Ω, add the following values.

Test frequency [Hz] Impedance of the tested device

9.2 kΩ < |Zx| ≤ 92 kΩ 92 kΩ < |Zx|

10 k - 100 k 0% 0.05%

100 k - 1 M 0.05% 0.05%

1 M - 2 M 0.10% 0.10%

The effect of cable extension

When the cable is extended, the following elements are added for every meter.

0.015 % × (Fm/1 MHz)2 × (L_cable)2

Fm [Hz] test frequency

L_cable [m] cable length

Short circuit bias Zs

Table 16 The impedance of the tested device is greater than 1.08 ohms

test

Frequency [Hz]

Measurement time mode

SHORT MED、 LONG

20 - 2 M 2.5 m Ω × (1 + 0.400/Vs) ×

(1 + √(1000/Fm))

0.6 mΩ × (1 + 0.400/Vs) ×

(1 + √(1000/Fm))

Table 17 The impedance of the tested device is ≤ 1.08 Ω

test

Frequency [Hz]

Measurement time mode

SHORT MED、 LONG

20 - 2 M 1 m Ω × (1 + 1/Vs) × (1 + √(1000/Fm)) 0.2 m Ω × (1 + 1/Vs)× (1 + √(1000/Fm))

Vs [Vrms] Test signal voltage

Fm [Hz] test frequency

The effect of cable extension (short-circuit bias)

Table 18 When the cable is extended, Zs increases by the following value (independent of the measurement time mode).

test

Frequency [Hz]

cable length

0 meters 1 meter 2 meters 4 meters

20 - 1 M 0 0.25 m Ω 0.5 mΩ 1 mΩ

1 M - 2 M 0 1 m Ω 2 mΩ 4 mΩ

Open circuit bias Yo

Table 19 Test signal voltage ≤ 2.0 Vrms

test

Frequency [Hz]

Measurement time mode

SHORT MED、 LONG

20 - 100 k 2 nS × (1 + 0.100/Vs) × (1 + √(100/Fm)) 0.5 nS × (1 + 0.100/Vs) × (1 + √(100/Fm))

100 k - 1 M 20 nS × (1 + 0.100/Vs) 5 nS × (1 + 0.100/Vs)

1 M - 2 M 40 nS × (1 + 0.100/Vs) 10 nS × (1 + 0.100/Vs)

Table 20 Test signal voltage>2.0 Vrms

test

Frequency [Hz]

Measurement time mode

SHORT MED、 LONG

measurement accuracy

The following impedance measurement calculation example is the result of absolute measurement accuracy.

Figure 1 Impedance measurement accuracy (test signal voltage=1 Vrms, cable length=0 meters, measurement time mode=MED)

compensation function

Table 28 E4980A provides three compensation functions: open circuit compensation, short circuit compensation, and load compensation.

Compensation type description

Error caused by stray admittance (C, G) of the open circuit compensation test fixture.

The error caused by the residual impedance (L, R) of the short-circuit compensation test fixture.

Load compensation compensates for the error between the actual measurement value and the known standard value under the measurement conditions required by the user.

List scanning

Points: The maximum number of points is 201.

The first scanning parameter (primary parameter): test frequency, test signal voltage, test signal current, test signal voltage of DC bias signal, test signal current of DC bias signal, and DC power supply voltage.

Second scanning parameter (secondary parameter): none, impedance range, test frequency, test signal frequency, test signal voltage, test signal current, test signal voltage for DC bias signal, test signal current for DC bias signal, DC power supply voltage

trigger mode

Sequential mode: Once E4980A is triggered, it will measure the device at all scanning points. /EOM/INDEX only outputs once.

Step mode: Each time E4980A is triggered, the scanning points will increase. At each point, there will be outputs of/EOM/INDEX, but the comparator function of the list scan will only provide results after the last/EOM output.

explanation

The parameter selected for one of the two parameters cannot be selected for the other parameter. Unable to set the combination of test signal voltage and test signal current, or one of the combinations of test signal voltage and test signal current for DC bias signal.

The secondary parameters can only be set through the SCPI command.

List scanning comparator function: The comparator function supports setting a pair of upper and lower limit values for each measurement point.

You can choose: to judge by the first scanning parameter/to judge by the second parameter/not to be used for each pair

Limit value.

Timestamp function: In sequential mode, the time when FW detects the trigger signal can be defined as 0 to record each time

Measure the start time of the measurement at the measurement point, and then obtain this time through the SCPI command.

Comparator function

Bin sorting: One parameter can be sorted into 9 BINs, OUT_SOF-BINS, AUX_BIN, and LOW-C_

REJECT。 The secondary parameters are sorted as HIGH, IN, and LOW. You can choose between sequential mode and tolerance mode as classification modes.

Limit setting: Absolute value, deviation value, and% deviation value can be used in the setting.

BIN count: can be recorded from 0 to 999999.

DC bias signal

Table 29 Test signal voltage

Range 0 V to+2 V

Resolution limited to 0 V/1.5 V/2 V

精度 0.1% + 2 mV (23°C ± 5°C)

(0.1% + 2 mV) × 4

(0 to 18 ° C or 28 to 55 ° C)

Output impedance: 100 ohms (nominal value)

Auxiliary measurement function

Data caching function: Each batch can read up to 201 measurement results.

Save/Call Function:

Up to 10 setting conditions can be written to or read from the built-in non-volatile memory.

Up to 10 setting conditions can be written to or read from USB memory.

When writing the setting conditions to register 10 of the USB memory, execute the automatic call function.

Button locking function: It can lock the front panel buttons.

GPIB: Pin D-Sub (D-24 type), female head; Compliant with IEEE 488.1, 2, and SCPI standards

USB host port: Universal Serial Bus socket, Type-A (4 contact positions, contact 1 on your left),

Yin head (only for connecting USB memory).

USB interface port: Universal Serial Bus socket, Type Mini-B (4 contact positions); Compliant with USBTMC-USB488 and USB 2.0 standards; Yin head; Used for connecting external controllers.

USBTMC: Abbreviation for USB Testing and Measurement Classification

LAN: 10/100 BaseT Ethernet, 8 pins (2 speed options)

LXI Consistency: Class C (only applicable to devices with fixed software version A.02.00 or higher)

explanation

The following USB storage devices can be used.

Compliant with USB 1.1 standard; Large capacity storage category,

FAT16/FAT32 format; The maximum current consumption is below 500 mA.

Recommended USB storage: 4GB USB flash memory

(Keysight PN 1819-0637) and 16GB USB flash

Save (Keysight PN 1819-1235).

Use the USB memory specifically recommended for E4980A,

Otherwise, previously saved data may be cleared. If you haven't

If the recommended USB memory is used, the data may not be available

Save or call normally.

For USB storage data loss caused by the use of E4980A, Shide Technology is not responsible.

Frequency options

E4980A 20 Hz to 2 MHz

E4980AL-032 20 Hz 至 300 kHz

E4980AL-052 20 Hz 至 500 kHz

E4980AL-102 20 Hz to 1 MHz

Table 30 Installable options

Option E4980A E4980AL

Power supply and DC bias enhancement (001) can be installed but not installed

DCR measurement (200) can be installed 1, cannot be installed 2

Robot arm interface (201) can be installed

Scanner interface (301) can be installed

Interface options

Option 201 (Robot Interface)

Add interfaces for robotic arms.

Option 301 (scanner interface)

Add scanner interface.

Option 710 (without interface)

Options without interfaces.

Up to 2 interface options can be installed on the interface connector of the rear panel.

Install two options 710 without installing the interface. When installing an interface, install the interface with the option number and one

Option 710.

Other options

Option 001 (Power Supply and DC Bias Enhancement)

Increase the voltage of the test signal and increase the variable DC bias voltage.

Option 007 (Standard Model)

Upgrade the entry-level model to the standard model (only applicable to E4980AU).

Option 200 (DCR measurement)

Increase DCR measurement.

1. Required Options

2. Equipped with DCR measurement function by default.

explanation

Option 007 can only be installed on E4980A equipped with option 005

In the middle.

explanation

E4980A-200/001 and E4980AL-032/052/102 support DCR measurement function.

Technical indicators for power supply and DC bias enhancement

Increase the test signal voltage and add the function of variable DC bias voltage.

The Vdc Idc measurement function is provided after installing option 001.

measurement parameters

The following parameters can be used.

Lp - Rdc

– Ls-Rdc

– Vdc-Idc

among which

Rdc DC resistance (DCR)

Vdc DC voltage

Idc DC current

test signal

signal level

Table 31 Test signal voltage

Range 0 Vrms to 20 Vrms (test frequency ≤ 1 MHz)

0 Vrms to 15 Vrms (test frequency>1 MHz)

分辨率 100 µVrms (0 Vrms - 0.2 Vrms)

200 µVrms (0.2 Vrms - 0.5 Vrms)

500 µVrms (0.5 Vrms - 1 Vrms)

1 mVrms (1 Vrms - 2 Vrms)

2 mVrms (2 Vrms - 5 Vrms)

5 mVrms (5 Vrms - 10 Vrms)

10 mVrms (10 Vrms - 20 Vrms)

Set precision to ± (10%+1 mVrms) (test signal voltage ≤ 2 Vrms)

(Test frequency ≤ 1 MHz: technical specifications, test frequency>1 MHz: typical values)

± (10%+10 mVrms) (test frequency ≤ 300 kHz,

Test signal voltage>2 Vrms (technical specifications)

± (15%+20 mVrms) (test frequency>300 kHz,

Test signal voltage>2 Vrms)

(Test frequency ≤ 1 MHz: technical specifications, test frequency>1 MHz: typical values)

Constant 1 ± (6%+1 mVrms) (test signal voltage ≤ 2 Vrms)

(Test frequency ≤ 1 MHz: technical specifications, test frequency>1 MHz: typical values)

± (6%+10 mVrms) (test frequency ≤ 300 kHz,

Test signal voltage>2 Vrms (technical specifications)

± (12%+20 mVrms) (test frequency>300 kHz,

Test signal voltage>2 Vrms) (test frequency ≤ 1 MHz: technical specifications,

Test frequency>1 MHz: typical value)

When the automatic level control function is turned on.

Test signal current

Range 0 Arms -100 mArms

Resolution 1 µ Arms (0 Arms -2 mArms)

2 µArms (2 mArms - 5 mArms)

5 µArms (5 mArms - 10 mArms)

10 µArms (10 mArms - 20 mArms)

20 µArms (20 mArms - 50 mArms)

50 µArms (50 mArms - 100 mArms)

Set precision to ± (10%+10 µ Arms) (test signal voltage ≤ 20 mArms)

(Test frequency ≤ 1 MHz: technical specifications, test frequency>1 MHz: typical values)

± (10%+100 µ Arms) (test frequency ≤ 300 kHz,

Test signal current>20 mArms (technical specifications)

± (15%+200 µ Arms) (test frequency>300 kHz,

Test signal voltage>20 mArms) (Test frequency ≤ 1 MHz: Technical specifications,

Test frequency>1 MHz: typical value)

Constant 1 ± (6%+10 µ Arms) (test signal voltage ≤ 20 mArms)

(Test frequency ≤ 1 MHz: technical specifications, test frequency>1 MHz: typical values)

± (6%+100 µ Arms) (test frequency ≤ 300 kHz,

Test signal voltage>20 mArms) (Technical specifications)

± (12%+200 µ Arms) (test frequency>300 kHz,

Test signal voltage>20 mArms) (Test frequency ≤ 1 MHz: Technical specifications,

Test frequency>1 MHz: typical value)

Test signal level monitoring function

- Can monitor test signal voltage and test signal current.

- Level monitoring accuracy:

Table 33 Test signal voltage monitoring accuracy (Vac)

Test signal voltage 2, test frequency technical indicators

5 mVrms to 2 Vrms ≤ 1 MHz ± (3% of reading+0.5 mVrms)

>1MHz ± (6% of reading+1 mVrms)

>2 Vrms ≤ 300 kHz ± (3% of reading+5 mVrms)

>300 kHz ± (6% of reading+10 mVrms) 3

Table 34 Test signal current monitoring accuracy (Iac)

Test signal current 2, test frequency technical indicators

50 µ Arms to 20 mArms ≤ 1 MHz ± (3% of reading+5 µ Arms)

>1MHz ± (6% of reading+10 µ Arms)

>20 mArms ≤ 300 kHz ± (3% of reading+50 µ Arms)

>300 kHz ± (6% of reading+100 µ Arms)

When the automatic level control function is turned on.

2. This is not the output value, but the displayed test signal level.

When the test frequency is greater than 1 MHz and the test signal voltage is greater than

Typical value at 10 Vrms.

DC bias signal

Table 35 Test signal voltage

Range -40 V to+40 V

Resolution setting resolution: 100 µ V, effective resolution:

330 v v (0v-5v)

1 mV ±(5 V - 10 V)

2 mV ±(10 V - 20 V)

5 mV ±(20 V - 40 V)

Accuracy test signal voltage ≤ 2 Vrms 0.1%+2 mV (23 ° C ± 5 ° C)

(0.1% + 2 mV) x 4

(0 to 18 ° C or 28 to 55 ° C)

Test signal voltage>2 Vrms 0.1%+4 mV (23 ° C ± 5 ° C)

(0.1% + 4 mV) x 4

(0 to 18 ° C or 28 to 55 ° C)

Table 36 Test signal current

Range -100 mA -100 mA

Resolution setting: 1 µ A, effective resolution:

3.3 µA ±(0 A - 50 mA)

10 µA ±(50 mA - 100 mA)

DC bias voltage level monitoring Vdc

(0.5% of reading+60 mV) x Kt

When measuring with Vdc Idc: (Technical specifications)

When using level monitoring: (typical value)

Kt temperature coefficient

DC bias current level monitoring Idc

(Measurement value A [%]+B [A]) × Kt

When measuring with Vdc Idc: (Technical specifications)

When using level monitoring: (typical value)

A [%] When the measurement time mode is SHORT: 2%

When the measurement time mode is MED or LONG: 1%

B [A] is given below

Kt temperature coefficient

When the measurement time mode is SMART, the following values double.

Test signal voltage ≤ 0.2 Vrms (measurement time mode=MED, LONG)

DC bias

current range

Impedance range [Ω]

< 100 100 300, 1 k 3 k, 10 k 30k, 100 k

20 µA 150 µA 30 µA 3 µA 300 nA 45 nA

200 µA 150 µA 30 µA 3 µA 300 nA 300 nA

2 mA 150 µA 30 µA 3 µA 3 µA 3 µA

20 mA 150 µA 30 µA 30 µA 30 µA 30 µA

100 mA 150 µA 150 µA 150 µA 150 µA 150 µA

Table 38 0.2 Vrms<test signal voltage ≤ 2 Vrms (measurement time mode=MED, LONG)

DC bias

current range

Impedance range [Ω]

< 100 100, 300 1k, 3 k 10k, 30 k 100 k

20 µA 150 µA 30 µA 3 µA 300 nA 45 nA

200 µA 150 µA 30 µA 3 µA 300 nA 300 nA

2 mA 150 µA 30 µA 3 µA 3 µA 3 µA

20 mA 150 µA 30 µA 30 µA 30 µA 30 µA

100 mA 150 µA 150 µA 150 µA 150 µA 150 µA

Table 39 Test signal voltage>2 Vrms (measurement time mode=MED, LONG)

DC bias

current range

Impedance range [Ω]

≤ 300 1 k, 3 k 10k, 30 k 100 k

20 µA 150 µA 30 µA 3 µA 300 nA

200 µA 150 µA 30 µA 3 µA 300 nA

2 mA 150 µA 30 µA 3 µA 3 µA

20 mA 150 µA 30 µA 30 µA 30 µA

100 mA 150 µA 150 µA 150 µA 150 µA

Table 40 Input impedance (nominal value)

Input impedance condition

Except for conditions below 0 ohms.

Test signal voltage ≤ 0.2 Vrms at 20 ohms, impedance range ≥ 3 k ohms, DC bias current range ≤ 200 µ A

Test signal voltage ≤ 2 Vrms, impedance range ≥ 10 k Ω, DC bias current range ≤ 200 µ A

Test signal voltage>2 Vrms, impedance range=100 k Ω, DC bias current range ≤ 200 µ A

DC power signal

Table 41 Test signal voltage

Range -10 V to 10 V

Resolution 1 mV

精度 0.1% + 3 mV（23 °C ±5 °C）

（0.1% + 3 mV） x 4

(0 to 18 ° C or 28 to 55 ° C)

Table 42 Test signal current

Range -45 mA to 45 mA (nominal value)

Output impedance

100 ohms (nominal value)

The direct current resistance (Rdc) measurement function is provided after installing E4980A-001/200 or E4980AL-032/052/102.

Accuracy of DC resistance (Rdc)

Absolute measurement accuracy Aa

The absolute measurement accuracy Aa is calculated according to the following formula

Equation 15: Aa=Ae+Acal

Aa absolute accuracy (% of reading)

Ae relative accuracy (% of reading)

Acal calibration accuracy

Relative measurement accuracy Ae

The relative measurement accuracy Ae is calculated according to the following formula

方程式 16： Ae = [Ab + (Rs /|Rm|+ Go × |Rm|) × 100 ] × Kt

Rm measurement value

Ab basic accuracy

Rs 短路偏置 [Ω]

Go open circuit bias [S]

Kt temperature coefficient

Calibration accuracy Acal

The calibration accuracy Acal is 0.03%.

Basic accuracy Ab

Table 43 The basic accuracy Ab is given below.

Measure time mode test signal voltage

≤ 2 Vrms > 2 Vrms

SHORT 1.00% 2.00%

MED 0.30% 0.60%

Open circuit bias Go

Table 44 The open circuit bias Go is given below.

Measure time mode test signal voltage

≤ 2 Vrms > 2 Vrms

SHORT 50 nS 500 nS

MED 10 nS 100 nS

Short circuit bias Rs

Table 45 The short-circuit bias Rs is given below.

Measure time mode test signal voltage

≤ 2 Vrms > 2 Vrms

SHORT 25 m Ω 250 mΩ

MED 5 m Ω 50 mΩ

The effect of cable length (short-circuit bias)

Table 46 When the cable is extended, the following values increase in Rs.

cable length

1 meter 2 meters 4 meters

0.25 m Ω 0.5 mΩ 1 mΩ

Temperature coefficient Kt

Table 47 The temperature coefficient Kt is given below.

Temperature [° C] Kt

0 - 18 4

18 - 28 1

28 - 55 4

power supply

Voltage 90 VAC -264 VAC

Frequency 47 Hz -63 Hz

Maximum power consumption of 150 VA

Table 49 working environment

Temperature 0-55 ° C

Humidity (≤ 40 ° C, no condensation) 15% -85% RH

Altitude: 0-2000 meters

Table 50 storage environment

Temperature -20-70 ° C

Humidity (≤ 60 ° C, no condensation) 0% -90% RH

Altitude from 0 meters to 4572 meters

External dimensions: 375 (width) x 105 (height) x 390 (depth) millimeters (nominal value)

The effective pixel count exceeds 99.99%. Perhaps 0.01% (approximately 7%)

Pixels or fewer are lost or constantly lit, but this is not the case

Obstacles.

Figure 6 Dimensions (side view, equipped with handle and buffer, in millimeters, nominal value)

Figure 7 Dimensions (side view, excluding handle and buffer, in millimeters, nominal value)

Weight: 5.3 kg (nominal value)

Display screen: LCD, 320 × 240 pixels, RGB color

The following items can be displayed:

- Measurement value

- Measurement conditions

- comparator limit and judgment result

- List Scan Table

- Self testing message

Supplementary information

EMC

EU Council Directive 2004/108/EC

IEC 61326-1:2012

EN 61326-1:2013

CISPR 11:2009 +A1:2010

EN 55011: 2009 +A1:2010

Group 1, Class A

IEC 61000-4-2:2008

EN 61000-4-2:2009

4 kV CD / 8 kV AD

IEC 61000-4-3:2006 +A1:2007 +A2:2010

EN 61000-4-3:2006 +A1:2008 +A2:2010

3 V/m, 80-1000 MHz, 1.4 - 2.0 GHz / 1V/m, 2.0 - 2.7 GHz, 80% AM

IEC 61000-4-4:2004 +A1:2010

EN 61000-4-4:2004 +A1:2010

1 kV power line/0.5 kV signal line

IEC 61000-4-5:2005

EN 61000-4-5:2006

0.5 kV line to line voltage/1 kV line to ground voltage

IEC 61000-4-6:2008

EN 61000-4-6:2009

3 V, 0.15-80 MHz, 80% AM

IEC 61000-4-8:2009

EN 61000-4-8:2010

30A/m, 50/60Hz

IEC 61000-4-11:2004

EN 61000-4-11:2004

0.5-300 times, 0%/70%

Explanation:

Unless the instrument frequency is the same as the test frequency of the transmitted interference signal (frequency around the carrier frequency and frequency around the modulation frequency), the measurement accuracy meets the technical specifications throughout the anti-interference test frequency range when measured under 3 V/m conditions according to EN61000-4-3.

ICES/NMB-001 ICES-001: 2006 Group 1, Class A

AS/NZS CISPR11:2004

Group 1, Class A

KN11, KN61000-6-1, and KN61000-6-2

Group 1, Class A

safety

EU Council Directive 2006/95/EC

IEC 61010-1:2001/EN 61010-1:2001

Measurement Category I, Pollution Level 2, Indoor Use

IEC60825-1:1994 Class 1 LED

CAN/CSA C22.2 61010-1-04

Measurement Category I, Pollution Level 2, Indoor Use

environment

This product complies with the WEEE Directive (2002/96/EC) labeling

requirement. Paste this label to indicate that do not dispose of this electrical/electronic product in household waste.

Product Category: According to WEEE

According to the equipment type classification in Appendix I of the instruction, this product belongs to the category of "monitoring instruments".

Table 51 Test frequency setting time

Test frequency setting time Test frequency (Fm)

5 ms Fm ≥ 1 kHz

12 ms 1 kHz > Fm ≥ 250 Hz

22 ms 250 Hz > Fm ≥ 60 Hz

42 ms 60 Hz > Fm

Table 52 Test signal voltage setting time

Test signal voltage setting time test frequency (Fm)

11 ms Fm ≥ 1 kHz

18 ms 1 kHz > Fm ≥ 250 Hz

26 ms 250 Hz > Fm ≥ 60 Hz

48 ms 60 Hz > Fm

The impedance range switching time is given below:

≤ 5 ms/range switching

Measurement circuit protection

The maximum discharge withstand voltage is given below. This parameter refers to the maximum value of the internal circuit when a charged capacitor is connected to an unknown terminal

High safety voltage value.

Table 53 Maximum discharge withstand voltage

Range of capacitance value C of the tested device for maximum discharge withstand voltage

1000 V C < 2 µF

√ 2/C V 2 µF ≤ C

Supplementary information

explanation

Capacitors need to be connected to unknown terminals or test fixtures first

Perform discharge to avoid damaging the instrument.

Figure 8 Maximum discharge withstand voltage

———

0

200

400

600

800

1000

1200

1.E–15 1.E–13 1.E–11 1.E–09 1.E–07 1.E–05 1.E–03

Voltage [V]

Capacitor [F]

definition

This is the time between triggering and end of measurement (EOM) output on the robotic arm interface.

condition

Table 54 shows the measurement time when the following conditions are met:

- Conventional impedance measurements other than Ls Rdc, Lp Rdc, and Vdc Idc

Impedance range mode: Maintain range mode

- DC bias voltage level monitoring: off

- DC bias current level monitoring: off

- Trigger latency: 0 seconds

Step delay: 0 seconds

- Calibration data: Off

- Display mode: Blank

Table 54 E4980A measurement time [ms] (DC bias: off)

measure time

pattern

test frequency

20 Hz 100 Hz 1 kHz 10 kHz 100 kHz 1 MHz 2 MHz

1 LONG 480 300 240 230 220 220 220

2 MED 380 180 110 92 89 88 88

3 SHORT 330 100 20 7.7 5.7 5.6 5.6

Figure 9 Measurement time (E4980A, DC bias: off)

20 100 1k 10k 100k 1M 2M

0.01

0.001

0.1

1

10

Test frequency [Hz]

Measurement time [seconds]

1. Long

2. Middle

3. Short

E4980A-005 measurement time [ms] (DC bias: off)

Measurement time mode test frequency

20 Hz 100 Hz 1 kHz 10 kHz 100 kHz 1 MHz 2 MHz

1 LONG 1190 650 590 580 570 570 570

2 MED 1150 380 200 180 180 180 180

3 SHORT 1040 240 37 25 23 23 23

Figure 10 Measurement time (DC bias: off, E4980A-005)

Table 56 E4980AL measurement time [ms]

Measurement time mode test frequency

20 Hz 100 Hz 1 kHz 10 kHz 100 kHz 1 MHz

1 LONG 729 423 363 353 343 343

2 MED 650 250 140 122 119 118

3 SHORT 579 149 26 14 12 12

Figure 11 Measurement time (E4980AL)

20 100 1k 10k 100k 1M 2M

0.01

0.001

0.1

1

10

Test frequency [Hz]

Measurement time [seconds]

1. Long

2. Middle

3. Short

20 100 1k 10k 100k 1M 2M

0.01

0.001

0.1

1

10

Test frequency [Hz]

Measurement time [seconds]

1. Long

2. Middle

3. Short

explanation

E4980A-005 has been scrapped and cannot be ordered again.

When the DC bias is turned on, increase the following time:

Table 57 Increased time when DC bias is turned on [ms]

test frequency

20 Hz 100 Hz 1 kHz 10 kHz 100 kHz 1 MHz 2 MHz

30 30 10 13 2 0.5 0.5

When the average increases, the measurement time is calculated according to the following formula

Equation 17: MeasTime+(Ave-1) × AveTime

MeasTime calculates the measurement time based on Tables 53 and 54

Average of Ave

See Table 56 for AveTime

Table 58 Time added when calculating the average [ms]

measurement

Time pattern

test frequency

20 Hz 100 Hz 1 kHz 10 kHz 100 kHz 1 MHz 2 MHz

SHORT 51 11 2.4 2.3 2.3 2.2 2.2

MED 110 81 88 87 85 84 84

LONG 210 210 220 220 220 210 210

Table 59 Measurement time when selecting Vdc Idc [ms]

Measurement time mode test frequency

20 Hz 100 Hz 1 kHz 10 kHz 100 kHz 1 MHz 2 MHz

SHORT 210 46 14 14 14 14 14

MED 210 170 170 170 170 170 170

LONG 410 410 410 410 410 410 410

Each additional average increases the same testing time

The measurement time increased when the Vdc and Idc monitoring functions are enabled.

Add the SHORT mode to Table 59. When using only Vdc or Idc, increase the Short mode by half in Table 59

Between.

Table 60 Measurement time when selecting Ls Rdc or Lp Rdc [ms]

Measurement time mode test frequency

20 Hz 100 Hz 1 kHz 10 kHz 100 kHz 1 MHz 2 MHz

SHORT 910 230 43 24 22 22 22

MED 1100 450 300 280 270 270 270

LONG 1400 820 700 670 660 650 650

For each additional average, increase the time by three times as much as the time added in Table 58

Except for displaying blank pages, update the display time required for each page as follows. In the process of change

When on screen, it will increase the drawing time and switching time. The measurement shows an update approximately every 100 ms.

Table 61 display time

Project as Vdc, Idc

When monitoring is turned off

When Vdc, Idc

When monitoring is turned on

MEAS PLAY page drawing time 10 ms 13 ms

MEAS PLAY page (larger) drawing time 10 ms 13 ms

BIN No. PLAY page drawing time 10 ms 13 ms

BIN COUNT PLAY page drawing time 10 ms 13 ms

LIST SWEEP LAY page drawing time 40 ms -

Measurement display switching time 35 ms -

Measure data transmission time

This table displays the measurement data transmission time under the following conditions. The transmission time of measurement data is affected by measurement conditions and computer

Different.

Table 62 Measurement transmission time under the following conditions:

Host computer: HP Z420 workstation, Xeon CPU ES-1620 0 0 @ 3.60 GHz

Display screen: Off

Impedance range mode: AUTO (no overload generated). ）

Open circuit/short circuit/load compensation: closed

Test signal voltage monitoring: Off

Table 63 Measurement data transmission time [ms]

Interface data

transmission format

Using: FETC? command

(Single point measurement)

Use data buffer storage

(List scanning measurement)

Comparator on comparator off 10 points, 51 points, 128 points, 201 points

GPIB ASCII 2 2 4 13 28 43

ASCII Long 2 2 5 15 34 53

Binary 2 2 4 10 21 36

USB ASCII 2 2 3 8 16 23

ASCII Long 2 2 4 9 19 28

Binary 2 2 3 5 9 13

LAN ASCII 3 4 5 12 24 36

ASCII Long 3 3 5 13 29 44

Binary 3 3 5 9 18 26

(1.5 V/2.0 V): Output current: Maximum 20 mA

Option 001 (Power Supply and DC Bias Enhancement):

DC bias voltage: The DC bias voltage applied to the tested device is calculated according to the following formula:

Equation 18: Vdut=Vb – 100 × Ib

Vdut [V] DC bias voltage

Vb [V] DC bias setting voltage

Ib [A] DC bias current

DC bias current: The DC bias current of the input device under test is calculated according to the following formula:

Equation 19: Idut=Vb/(100+Rdc)

Idut [A] DC bias current

Vb [V] DC bias setting current

Rdc [Ω] DC resistance of the tested device

Maximum DC bias current

Table 64 The maximum DC bias current that can be measured normally.

Impedance range

[Ω]

Bias current isolation

open close

Test signal voltage ≤ 2 Vrms Test signal voltage>2 Vrms

0.1 Automatic range mode:

100 mA

Maintain range mode:

The values applicable to this range.

20 mA 100 mA

1 20 mA 100 mA

10 20 mA 100 mA

100 20 mA 100 mA

300 2 mA 100 mA

1 k 2 mA 20 mA

3 k 200 µA 20 mA

10 k 200 µA 2 mA

30 k 20 µA 2 mA

100 k 20 µA 200 µA

When applying DC bias to the tested device

When applying a DC bias to the device under test, the absolute accuracy Ab increases by the following value

Table 65 Only when Fm<10 kHz and | Vdc |>5 V

SHORT MED、 LONG

0.05% × (100 mV/Vs) × (1 + √(100/Fm)) 0.01% × (100 mV/Vs) × (1 + √(100/Fm))

Fm [Hz] test frequency

Vs [V] test signal voltage

When the DC bias isolation is set to ON, the open circuit bias Yo increases by the following value.

Equation 20:Yo_DCI1 × (1 + 1/(Vs)) × (1 + √(500/Fm)) + Yo_DCI2

Zm [Ω] measured device impedance

Fm [Hz] test frequency

Vs [V] test signal voltage

Yo_SCI1,2 [S] Calculate this value using Tables 61 and 62

Idc [A] DC bias isolation current

Table 66 Yo_SCI1 value

DC bias current range measurement time mode

SHORT MED、 LONG

20 µA 0 S 0 S

200 µA 0.25 nS 0.05 nS

2 mA 2.5 nS 0.5 nS

20 mA 25 nS 5 nS

100 mA 250 nS 50 nS

Table 67 Yo_SCI2 value

DC bias current

scope

Measurement time mode

≤ 100 Ω 300 Ω, 1 k Ω 3 k Ω, 10 k Ω 30 k Ω, 100 k Ω

20 µA 0 S 0 S 0 S 0 S

200 µA 0 S 0 S 0 S 0 S

2 mA 0 S 0 S 0 S 3 nS

20 mA 0 S 0 S 30 nS 30 nS

100 mA 0 S 300 nS 300 nS 300 nS

DC bias establishment time

When the DC bias is set to ON, the setup time increases by the following value:

Table 68 DC bias establishment time

Bias establishment time

1. Standard tested device capacitance x 100 x logarithmic (2/1.8 m)+3 m

Option 001: Tested Device Capacity x 100 x Loge (40/1.8 m)+3 m

1 µF 10 µF 100 µF 1 mF 10 mF 100 mF

Tested device capacitance

Chart creation time

12. DC bias establishment time