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    Building 288, Meirenshan Middle Road, Xike Town, Tong'an District, Xiamen City, Fujian Province

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Desktop high and low temperature test chamber

NegotiableUpdate on 05/06
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Overview

Desktop high and low temperature test chamber, also known as high and low temperature test chamber, is a detection equipment used to simulate special temperature environments. It is mainly used in fields such as electronics and electrical engineering, automobiles and motorcycles, aerospace, marine weapons, universities, research institutions, etc., to test the physical performance indicators of product components and materials through high and low temperature (alternating) cycles.

Product Details

Desktop high and low temperature test chamber, also known as high and low temperature test chamber, is a detection equipment used to simulate special temperature environments. It is mainly used in fields such as electronics and electrical engineering, automobiles and motorcycles, aerospace, shipbuilding and weapons, universities, research institutions, etc. It tests the physical performance indicators of product components and materials through high and low temperature (alternating) cycles.

Desktop high and low temperature test chamberAdopting optimized design, equipped with TFT true color LCD touch screen and window observation window, achieving a temperature range of -70 ℃ to 150 ℃, with a temperature stability of ± 0.5 ℃. Configure a cascade compressor refrigeration system, electric heating wire/PTC heating system, and air circulation system, in compliance with international standards such as GB/T2423 and IEC60068, and provide air-cooled cooling.

meet the standard

GB/T2423.1-2008 Test A: Low temperature test method; GB/T10589-2008 Technical Conditions for Low Temperature Test Chamber; GB/T2423.2-2008 Test B: High temperature test method GB/T11158-2008 Technical conditions for high temperature test chamber; GB/T10592-2008 Technical conditions for high and low temperature test chambers; GJB150.3 High temperature test; GB/T2423.22-2002 Test N: Temperature variation test method; GJB150.4 Low temperature test; IEC60068-2-1:2007 Low temperature test chamber test method; IEC68-2-2 Test B: Dry Heat; IEC60068-2-2:2007 High temperature test chamber test method; IEC68-2-1 Test A: Cold; Desktop High and Low Temperature Testing Machine - Equipment Features