- Phone
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Address
3rd Floor, Building 34, No.1 Changjiang Road, Mudu Town, Wuzhong District, Suzhou City
Suzhou Hanji Automation Co., Ltd
3rd Floor, Building 34, No.1 Changjiang Road, Mudu Town, Wuzhong District, Suzhou City
1. High hardware configuration: 7-inch TFT pure color capacitive touch screen; Bluetooth 4.0; Concave grating;
2. Dual array 256 pixel CMOS detector; High lifespan and stable full spectrum LED/UV LED;
3. Measure the reflection and transmission spectra of the sample, with precise Lab data that can be used for color matching and accurate color transfer;
4. Caliber automatic recognition, with four calibers of Φ 25.4/15/8/4mm to switch freely, while taking into account the special needs of customers;
5. Temperature monitoring and compensation, with built-in temperature sensors to monitor and compensate for the testing environment, ensuring more accurate measurement results;
6. The testing wavelength range is 360-780nm, with built-in 400nm/420nm cut-off for more professional UV testing;
7. Independent light source detector, constantly monitoring changes in the light source to ensure its reliability;
8. Multiple measurement modes: quality control mode, sample mode, to meet the needs of more customers;
9. Multiple optional accessories: reflective sample clamping tool, transmission fixing bracket, micro hole 4mm transmission fixture, instrument inverted testing fixture, suitable for more working conditions;
10. Large capacity storage space, capable of storing approximately 40000 pieces of test data;
11. Built in camera for framing and positioning;
12. PC software has * extension functions.
Desktop spectrophotometer | ||
Product model |
YS6060 |
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lighting method |
Reflection:D/8(漫射照明,8Direction receiving); |
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feature |
Used for precise color analysis and transmission in the laboratory; |
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Integrating sphere size |
Φ154mm |
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照明光源 |
360~780nmcombinationLEDLight source,400nmCut off the light source,420nmCut off light source |
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Spectral method |
Concave grating |
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sensor |
256Pixel dual arrayCMOSImage sensor |
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Measuring wavelength range |
360~780nm |
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wavelength interval |
10nm |
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Half bandwidth |
10nm |
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Reflectance measurement range |
0~200% |
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Measuring caliber |
Reflection: Φ30mm/Φ25.4mm,Φ18mm/Φ15mm,Φ10mm/Φ8mm,Φ6mm/Φ4mm; |
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Light containing method |
reflectionSCI/SCE, transmissionSCI/SCE |
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color space |
CIE LAB,XYZ,Yxy,LCh,CIE LUV,Musell,s-RGB,HunterLab,Bxy,DIN Lab99 |
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colour-difference formula |
ΔE*ab,ΔE*uv,ΔE*94,ΔE*cmc(2:1),ΔE*cmc(1:1),ΔE*00, DINΔE99,ΔE(Hunter) |
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Other chromaticity indicators |
WI(ASTM E313,CIE/ISO,AATCC,Hunter), |
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Observer's perspective |
2°/10° |
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Observing light source |
D65,A,C,D50,D55,D75,F1,F2,F3,F4,F5,F6,F7,F8,F9,F10,F11,F12 |
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display |
spectrogram/Data, sample chromaticity value, color difference value/Image, color chart, color simulation, qualified/Unqualified result, color deviation |
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measure time |
about2.4s(Simultaneously testing)SCI/SCEabout5s) |
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repetitiveness |
Spectral reflectance: Φ25.4mm/SCI,standard deviation0.04%Within(400~700nm:0.04%Within): |
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Inter station difference |
Φ25.4mm/SCI,ΔE*ab 0.12Within(BCRASeries II 12Average value of block color board measurement |
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size |
longXwideXtall=370X300X200mm |
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weight |
about9.6kg |
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power supply method |
direct current24V,3APower adapter for power supply |
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Lighting source lifespan |
5Year over300Ten thousand measurements |
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display |
TFTTrue Color7inchCapacitive touch screen |
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interface |
USB, Bluetooth® fourPrint serial port |
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store data |
reference material5000Article, sample40000Article(SCI/SCECalculate a piece of data |
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language |
Simplified Chinese, Traditional Chinese,English,(Customizable in German, French, and Spanish) |
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Operating temperature range |
0~40℃(32~104°F) |
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Storage temperature range |
-20~50℃(-4~122°F) |
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Standard Appendix |
Power adapter, manual, quality management software(download)Data cable, standard calibration board, black calibration box, transmission black baffle, sample holder,25.4Caliber,15Caliber,8Caliber,4Caliber, transmission testing fixture components |
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Optional attachments |
Micro printer, micro hole(4mm)Transmission testing fixture components, inverted instrument testing fixtures |
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Note: |
If there are any changes, no further notice will be given |
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