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Shenzhen Dispu Equipment Co., Ltd
DSP-STC2258 Multi functional Digital Four Point Probe Tester
NegotiableUpdate on 04/25
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Overview
The DSP-STC2258 multifunctional digital four probe tester is a multi-purpose comprehensive measuring instrument that uses the four probe measurement principle to test resistivity/square resistance. The DSP-STC2258 multifunctional digital four point probe tester complies with GB/T 1551-2009 "Method for Measuring Silicon Single Crystal Resistance", GB/T 1551-1995 "DC Two Point Probe Method for Measuring Silicon and Germanium Single Crystal Resistance", GB/T 1552-1995 "DC Four Point Probe Method for Measuring Silicon and Germanium Single Crystal Resistance" and references the American A.S.T.M standard.
Product Details
mechanical properties
DSP-STC2258 multifunctional digital four probe tester
1overview
The DSP-STC2258 multifunctional digital four probe tester is a multi-purpose comprehensive measuring instrument that uses the four probe measurement principle to test resistivity/square resistance. The instrument is designed in accordance with GB/T 1551-2009 "Method for Measuring the Electrical Resistance of Silicon Single Crystals", GB/T 1551-1995 "DC Two Probe Method for Measuring the Electrical Resistance of Silicon and Germanium Single Crystals", GB/T 1552-1995 "DC Four Probe Method for Measuring the Electrical Resistance of Silicon and Germanium Single Crystals", and references the American A.S.T.M standard.
The complete set of instruments consists of a host, an optional four probe probe, a testing bench, and other parts.
The host is mainly composed of a precision constant current source, a high-resolution ADC, and an embedded microcontroller system. All parameter settings and function conversions of the instrument are input using a digital keyboard; It has zero position and full degree self calibration functions; Automatic conversion range of voltage and current; The test results are directly displayed in the numerical header. This tester is specially equipped with a test result classification function, with 10 major categories.
Probe selection: Depending on the characteristics of different materials, there are multiple options available for the probe. There are high wear-resistant tungsten carbide probe probes to test the resistivity/square resistance of hard materials such as silicon-based semiconductors, metals, conductive plastics, etc; There are also spherical gold-plated copper alloy probe probes that can measure the resistivity/resistivity of semiconductor materials such as conductive thin films, metal coatings or thin films, conductive films (ITO films) or nano coatings on substrates such as flexible materials, ceramics or glass. By replacing the four terminal testing fixture, it is also possible to measure the resistance of the resistor body, the low and median resistance of the metal conductor, and the contact resistance of switches. Equipped with a dedicated probe, it can also test the resistivity square resistance of coatings on battery electrodes and other foils.
Test bench selection: The SZT-A, SZT-B, SZT-C, or SZT-F type test bench is commonly used for resistivity/square resistance testing using the four probe method. The SZT-K type test bench or SZT-D type test bench can be selected for testing the resistivity of semiconductor powders using the two probe method, and SZT-G type test bench can be selected for testing the resistivity of rubber materials. Please refer to the "Characteristics and Selection Reference of Four Probe Instruments, Probes, and Test Benches" for details
The instrument has the characteristics of high measurement accuracy, high sensitivity, good stability, high intelligence, compact structure, and easy use.
The instrument is suitable for testing the conductivity of conductors, semiconductors, and semiconductor like materials in semiconductor material factories, research institutions, and universities.
The complete set of instruments consists of a host, an optional four probe probe, a testing bench, and other parts.
The host is mainly composed of a precision constant current source, a high-resolution ADC, and an embedded microcontroller system. All parameter settings and function conversions of the instrument are input using a digital keyboard; It has zero position and full degree self calibration functions; Automatic conversion range of voltage and current; The test results are directly displayed in the numerical header. This tester is specially equipped with a test result classification function, with 10 major categories.
Probe selection: Depending on the characteristics of different materials, there are multiple options available for the probe. There are high wear-resistant tungsten carbide probe probes to test the resistivity/square resistance of hard materials such as silicon-based semiconductors, metals, conductive plastics, etc; There are also spherical gold-plated copper alloy probe probes that can measure the resistivity/resistivity of semiconductor materials such as conductive thin films, metal coatings or thin films, conductive films (ITO films) or nano coatings on substrates such as flexible materials, ceramics or glass. By replacing the four terminal testing fixture, it is also possible to measure the resistance of the resistor body, the low and median resistance of the metal conductor, and the contact resistance of switches. Equipped with a dedicated probe, it can also test the resistivity square resistance of coatings on battery electrodes and other foils.
Test bench selection: The SZT-A, SZT-B, SZT-C, or SZT-F type test bench is commonly used for resistivity/square resistance testing using the four probe method. The SZT-K type test bench or SZT-D type test bench can be selected for testing the resistivity of semiconductor powders using the two probe method, and SZT-G type test bench can be selected for testing the resistivity of rubber materials. Please refer to the "Characteristics and Selection Reference of Four Probe Instruments, Probes, and Test Benches" for details
The instrument has the characteristics of high measurement accuracy, high sensitivity, good stability, high intelligence, compact structure, and easy use.
The instrument is suitable for testing the conductivity of conductors, semiconductors, and semiconductor like materials in semiconductor material factories, research institutions, and universities.
2、 Basic technical parameters
1. Measurement range and resolution (indicated in parentheses as expandable by one order of magnitude)
Resistance: 10.0 × 10-6～ 200.0×103 Ω, resolution 1.0 × 10-6～ 0.1×103 Ω
（1.0×10-6～ 20.00×103 Ω, resolution 0.1 × 10-6 ～ 0.01×103Ω）
Electrical resistivity: 10.0 × 10-6～ 200.0×103Ω - cm resolution 1.0 × 10-6～ 0.1×103 Ω-cm
（1.0×10-6～ 20.00×103 Ω - cm resolution 0.1 × 10-6～ 0.01×103Ω-cm）
Block resistance: 50.0 × 10-6～ 1.0×106Ω/□ resolution 5.0 × 10-6～ 0.5×103 Ω/□
（5.0×10-6～ 100.0×103Ω/□ resolution 0.5 × 10-6～ 0.1×103 Ω/□）
2. Material size (determined by the optional testing platform and testing method)
Diameter: SZT-A round test bench, direct testing method with a diameter of 15~130mm, handheld mode not limited
SZT-B/C/F square test bench direct testing method 180mm × 180mm, handheld mode is not limited
Length (height): The direct testing method of the test bench is H ≤ 100mm, and the handheld method is not limited
Measurement direction: both axial and radial directions are available
3. Range division and error level
Resistance: 10.0 × 10-6～ 200.0×103 Ω, resolution 1.0 × 10-6～ 0.1×103 Ω
（1.0×10-6～ 20.00×103 Ω, resolution 0.1 × 10-6 ～ 0.01×103Ω）
Electrical resistivity: 10.0 × 10-6～ 200.0×103Ω - cm resolution 1.0 × 10-6～ 0.1×103 Ω-cm
（1.0×10-6～ 20.00×103 Ω - cm resolution 0.1 × 10-6～ 0.01×103Ω-cm）
Block resistance: 50.0 × 10-6～ 1.0×106Ω/□ resolution 5.0 × 10-6～ 0.5×103 Ω/□
（5.0×10-6～ 100.0×103Ω/□ resolution 0.5 × 10-6～ 0.1×103 Ω/□）
2. Material size (determined by the optional testing platform and testing method)
Diameter: SZT-A round test bench, direct testing method with a diameter of 15~130mm, handheld mode not limited
SZT-B/C/F square test bench direct testing method 180mm × 180mm, handheld mode is not limited
Length (height): The direct testing method of the test bench is H ≤ 100mm, and the handheld method is not limited
Measurement direction: both axial and radial directions are available
3. Range division and error level
| Full display |
200.0
|
20.00
|
2.000
|
200.0
|
20.00
|
2.000
|
200.0
|
20.00
|
2.000
|
| Conventional range |
kΩ-cm/□
|
kΩ-cm/□
|
Ω-cm/□
|
mΩ-cm/□
|
---
|
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| *Large expansion range |
---
|
kΩ-cm/□
|
Ω-cm/□
|
mΩ-cm/□
|
mΩ-cm/□
|
||||
| Basic error |
±2%FSB
±4LSB
|
±1.5%FSB
±4LSB
|
±0.5%FSB±2LSB |
±0.5%FSB
±4LSB
|
±1.0%FSB
±4LSB
|
||||
3. Working power supply: 220V ± 10%, f=50Hz ± 4%, PW≤5W
4. Dimensions: 245mm (length) x 220mm (width) x 95mm (height)
Net weight: ≤ 1.5-2.0kg
4. Dimensions: 245mm (length) x 220mm (width) x 95mm (height)
Net weight: ≤ 1.5-2.0kg
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