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E-mail
ryu@ultrablue-sci.com
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Phone
13331917708
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Address
Room 302, Building 11, 999 Jiangyue Road, Minhang District, Shanghai
Shanghai Beilan Optoelectronics Technology Co., Ltd
ryu@ultrablue-sci.com
13331917708
Room 302, Building 11, 999 Jiangyue Road, Minhang District, Shanghai
This measuring device is used for measuring the scattering characteristics of various materials. The measurement of sample reflection and transmission radiance under different geometric conditions of incidence and reflection (transmission) is achieved through one-dimensional rotation of the light source and two-dimensional rotation of the detector. The system includes a collimated light source, a light source bracket, an adjustable sample bracket, a detector, a detector rotation mechanism, a detector bracket, and testing software.
BRDF/BTDF testerMain testing parameters
Ø Polychromatic and Monochromatic BRDF
Ø Polychromatic and Monochromatic BTDF
Ø Reflected and transmitted light flux at different angles
Ø Reflected and transmitted radiance at different angles
Scattering light temperature and color coordinates of materials at different angles
BRDF/BTDF testersystem architecture
1. Light source
To improve the signal-to-noise ratio of the scattered signal of the sample, a wide spectrum and high brightness tungsten halogen lamp is used as the light source, and the light is collimated through a collimating lens and emitted onto the sample.
Ø Different sizes of light spots can be achieved by adjusting the focal length of the lens.
Ø The light source can also be equipped with a filter to achieve monochromatic light of different colors.
2. Detector
Using a silicon detector with a detection range of 350nm-1000nm.
The detector converts the optical signal into an electrical signal, which is amplified by a lock-in amplifier and extracted from the frequency of the chopper to obtain the spectral DN value.
3. Software section
In order to improve measurement speed and accuracy, a measurement and control software has been specially developed for the device, which supports automatic measurement of scattering characteristics under various geometric conditions at once. Firstly, measure the incident radiance of the light source, and then measure the reflected radiance of the sample diffuser plate under geometric conditions. Repeat this process until all the scattering characteristic measurements under the set geometric conditions are completed, and the software directly outputs the scattering characteristic curve.