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E-mail
rapidxafs@rapid-xas.com
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Phone
18130086708
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Address
201, Building G6, Xingmengyuan Entrepreneurship Park, No. 198 Mingzhu Avenue, High tech Zone, Hefei City, Anhui Province
Product Categories
Anhui Absorption Spectroscopy Instrument Equipment Co., Ltd
Anhui absorption spectrum RapidXAFS 2D Ultra
NegotiableUpdate on 02/02
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Overview
The RapidXAFS 2D Ultra adopts a dual Roland circle structure design, which can generate dual beams of monochromatic light, achieve a doubling of luminous flux, or generate two beams of monochromatic light with different energies for simultaneous testing of two elements, further improving the overall performance of laboratory type XAFS equipment. Conduct high-quality XAFS testing in conventional laboratories.
Product Details
Core strengths
For a long time, X-ray absorption fine structure spectroscopy (XAFS) has only been tested on various synchrotron radiation sources. Due to the limited time of the light source machine, it cannot meet the testing needs of many researchers. In recent years, XAFS data has become a standard feature for top journals, leading to an increasing number of research groups requiring XAFS testing. Adhering to the concept of letting XAFS enter every laboratory, the Institute of High Energy Physics of the Chinese Academy of Sciences and the University of Science and Technology of China jointly launched a new X-ray absorption fine structure spectrometer (RapidXAFS).
Desktop XAFSProduct advantages:
multi-function: |
Provide research grade high-quality XAFS spectra |
High performance: |
Complete 1% content sample testing within 1 hour |
Energy Range: |
4.5-20 keV， Scalable up to 205keV |
High luminous flux: |
>4,000,000 photons/ sec@7 ~9 KeV |
Test elements: |
Implementing XAFS testing for 3D, 5D, rare earth element transition metals |
Easy to use: |
Only half a day of training is needed to operate the machine |
Autonomous and controllable: |
90% of components are independently controllable and have no policy risks |
Low maintenance cost: |
No need for dedicated maintenance, operation, management, etc |
RapidXAFS has the following characteristics:
Highest luminous flux product
Photon flux higher than 1000000 photons/second/eV -200000photons/second/eV, with spectral efficiency several times higher than other products; Obtain data quality equivalent to synchrotron radiation
Excellent stability
The stability of monochromatic light intensity of the light source is better than 0.1%, and the energy drift during repeated collection is less than 50 meV
1% detection limit
High luminous flux, excellent optical path optimization, and good light source stability ensure high-quality EXAFS data even when the measured element content is>1%
Instrument principle
X-ray absorption fine structure (XAFS) is a powerful tool for studying the local atomic or electronic structure of materials, widely used in popular fields such as catalysis, energy, and nanotechnology.
Desktop XAFS mainly has the following advantages:
1. It does not rely on long-range ordered structures and can be used for the study of amorphous materials;
2. Without interference from other elements, different elements in the same material can be studied separately;
3. The sample is undamaged and can be tested in situ under atmospheric conditions;
4. It is not affected by the sample state and can measure solids (crystals, powders), liquids (solutions, molten states), gases, etc;
5. It can obtain structural parameters such as coordination atom type, coordination number, and atomic spacing, with an atomic spacing accuracy of up to 0.01A.
