Guwei Electronics launches AFG-3000 series arbitrary waveform signal generators for 20MHz/30MHz single isolated channel and double isolated channel, suitable for industrial, scientific research, and educational fields
Guwei Electronics has launched the AFG-3000 series, which includes 20MHz/30MHz single isolated channel and double isolated channel arbitrary waveform signal generators, suitable for industrial, scientific research, and educational fields. In the design of isolated output, all output channels are grounded and isolated from the ground, which is suitable for testing applications in floating circuits. For example, when connected in series with the DC voltage of a power supply, the maximum output of DC plus AC can reach+42V or -42V. Moreover, dual channels can be used independently or multiple instruments can output simultaneously without considering grounding reference issues, such as engine controllers or transmission devices in automotive electronics. They offer arbitrary waveform characteristics with a sampling rate of 250 MSa/s, 16 bit resolution, and 8 M memory depth. In addition to downloading pre edited waveform files to memory to generate arbitrary waveforms, users can also use the built-in DSOLink function of the AFG-3000 series to copy and generate signals measured by the Guwei electronic digital oscilloscope.
The AFG-3000 series supports multi-channel synchronous phase operation, with up to 6 units and 12 channels of phase synchronization. Users can input a 10 MHz atomic clock frequency standard through an external signal source to improve the accuracy of frequency output. Supports frequency scanning and amplitude scanning, which can be combined with linear/logarithmic, unidirectional (sawtooth wave)/bidirectional (triangular wave), continuous/single trigger/threshold trigger functions to achieve various application requirements through different scanning methods. Frequency scanning can test the frequency response of electronic components such as filters and low-frequency amplifiers. Amplitude scanning can simulate vibration testing (in combination with vibration testers), fatigue aging testing of various materials, and linearity testing of low-frequency amplifiers, among others.