105J digital measuring microscope

NegotiableUpdate on 01/04

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Overview

105J digital measuring microscope

Product Details

105JType digital measuring microscope

■Instrument usage:

1. 105Jtype(Original)JGW-SDigital measuring microscope(Hereinafter referred to as the instrument)It is a large-scale measuring microscope. This device

The instrument adopts a linear displacement grating sensor measurement system, which is a highly efficient optical metrology instrument. It has the characteristics of intuitive and simple reading, improved work efficiency, and uses granite as the instrument base for better stability. It is widely used in the metrological testing of various enterprises, testing and calibration laboratories at all levels, and other scientific research departments for metrological testing work. The instrument has high measurement accuracy,

2. Specially suitable for precise measurement of length and angle, and equipped with multiple accessories, its range of use is fully expanded.

3. The instrument can use imaging or contact methods to accurately measure the length, angle, and shape of mechanical tools and components in Cartesian or polar coordinates. The main measuring objects include: cutting tools, measuring tools, molds, sample workpieces, etc.

4. The digital display device of the instrument is equipped with a data output interface, which can be extended to connect to a two-dimensional data collector and a computer. With the addition of two-dimensional measurement software, it can be upgraded to105JPCType of microcomputer measuring microscope.

■Measurement range and grid valuespecifications

X－YMeasuring Range	150×100mm(Purchase)200×150mm)
measurement resolution	0.001mm
Aim at the lifting stroke of the microscope	120mm
Angle measurement range of angle measuring eyepiece	360°
Dividing value of angle measuring eyepiece	1´
Measuring range of contour eyepiece	±7°
Contour eyepiece division value	10´
Outline eyepiece arc dividing plate	Curvature radius Rself0.1to100mm
Optical locator probe diameter	φ3±0.1mm
Verification limit error of probe diameter	≤0.0005mm
Optical locator for measuring force	0.098±0.0196N
Maximum measurement depth of optical locator	15mm
Glass countertop size	225mm
Maximum carrying capacity	15kg
Instrument input voltage	AC 220V 50HZ
Instrument power consumption	100W
Output voltage	AC 6V
External dimensions of the instrument host	550×500×60mm
Net weight of instrument host	250kg

■Optical parameters of aiming microscope

Indicator value of objective magnification factor		l×	3×	5×
total magnification	Use angle measuring or contour eyepiece	10×	30×	50×
total magnification	Using a binocular eyepiece	15×	42×	65×
Object field of view (mm)	Use angle measuring or contour eyepiece	φ20	φ6.6	φ4
Object field of view (mm)	Using a binocular eyepiece	φ13	φ4.7	φ3
work distance (mm)	Use angle measuring or contour eyepiece	8l	90	65
work distance (mm)	Using a binocular eyepiece	47	85	63

■Instrument accuracy: Under the specified temperature conditions, the instrument has the following guarantees:

x、yCoordinates: Using glassmmDividing ruler Accuracy of the instrument during calibration	（4+L/25）μm LFor the measurement range, unit:mm
Angle measuring eyepiece: accuracy of measuring angles	≤1′
Dual image eyepiece: instability of combined images	≤0.001mm
Dual image eyepiece: incorrect image combination	≤0.001mm
Optical locator: measurement instability	≤0.001mm
Optical locator: measurement inaccuracy	≤0.0015mm