- Phone
-
Address
Room 311, Building 5, No. 526 Fute East Third Road, Pudong Waigaoqiao Free Trade Zone, Shanghai
Duzhi Instrument (Shanghai) Co., Ltd
Room 311, Building 5, No. 526 Fute East Third Road, Pudong Waigaoqiao Free Trade Zone, Shanghai
Taylor portable roughness tester SURTRONIC Duo from the UK
The roughness meter, also known as surface roughness meter, surface smoothness meter, surface roughness detector, roughness measuring instrument, roughness meter, roughness tester and other names, was first developed and produced abroad before being introduced to China. There are many types of Taylor roughness meters, and the commonly used contour meters are DUO and 25. If measuring roughness with just one finger, it would be DUO and 25.
DUO is divided into two hemispheres, and the measurement and operation parts can be separated through wireless signal transmission. This means that during measurement, the operator does not need to be present on the spot, and can simply hold the display part to see the reading. This is the old model, while the new model is square and detachable.
Taylor portable roughness tester SURTRONIC Duo from the UK
25 is a stylus roughness meter. First, connect the sensor to the adjustable bracket at the front end of the instrument, and connect the sensor tail end to the instrument through a wire. When the stylus contacts the measured workpiece vertically, the instrument sensor senses the surface of the workpiece and measures it when turned on. The height of the sensor can be adjusted through the adjustable bracket at the front end
Features:
Durability: Even if accidentally operated, it will not be easily damaged.
Maintainability: It can easily remove dust and oil stains accumulated during use.
Applicability One can be used as a filter to remove the highest surface frequencies, which provide more reliable measurement results in a controlled environment. Other Taylor Hopson instruments use probes with a radius of 2 um (80 uin). When used with an induction measuring head with a smaller radius and lower contact force, it can be used to analyze the smallest surface defects.