Welcome Customer !

Membership

Help

Duzhi Instrument (Shanghai) Co., Ltd
Custom manufacturer

Main Products:

instrumentb2b>Products

Duzhi Instrument (Shanghai) Co., Ltd

  • E-mail

  • Phone

  • Address

    Room 311, Building 5, No. 526 Fute East Third Road, Pudong Waigaoqiao Free Trade Zone, Shanghai

Contact Now

Fischer DELTASCOPE DMP10

NegotiableUpdate on 05/06
Model
Nature of the Manufacturer
Producers
Product Category
Place of Origin

Overview

The Fischer DELTASCOPE DMP10 $r $nDMP10-40 contact and non-destructive coating thickness measurement $r $nDMP10-40 series measuring instrument is a solution for quickly and non destructively measuring coating thickness on magnetic and non-magnetic substrates. These compact instruments are primarily used for quality assurance, impressing with their sturdy and ergonomic design and extensive functionality.

Product Details

Fischer DELTASCOPE DMP10

The DMP10-40 series measuring instrument is a solution for rapid and non-destructive measurement of coating thickness on magnetic and non-magnetic substrates. These compact instruments are primarily used for quality assurance, impressing with their sturdy and ergonomic design and extensive functionality.

菲希尔DELTASCOPE DMP10

We provide you with a wide range of high-precision probes for coating thickness measurement and material testing. from100 We will work with you to find the right probe for your measurement task, including various standard probes, numerous special probes, and digital probes used for specific instruments. allFischerThe probes are very sturdy, wear-resistant, and have undergone research and development, production, and internal testing to meet high-quality standards. Simply connect the pre calibrated probe to your measuring instrument to start using: the instrument will automatically recognize the probe. Fischer DELTASCOPE DMP10

Due to the use of a spring-loaded system, our probe is placed on the surface of the workpiece with good pressure. This reduces measurement errors and achieves high repeatability, ensuring your measurement results. A probe with curvature compensation function can perform reliable measurements on curved surfaces. On the other hand, probes with conductivity compensation function can compensate for different conductivities of the substrate, thereby avoiding time-consuming calibration procedures.