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Zhengzhou Chengyue Scientific Instrument Co., Ltd

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The influence of electron beam evaporation coating technology on the strength of chemically tempered glass cover plates is a complex problem involving materials science, mechanical properties, and interface engineering. The following is a systematic analysis from the perspectives of mechanism of action, experimental data, and process optimization:


1. The mechanism of electron beam evaporation coating on glass strength

(1)Reconstruction of surface stress field

Characteristics of chemically tempered glass:passK?-Na?Ion exchange forms a surface compressive stress layer (usually500-800MPa, Depth30-100μm)It is the main source of strength.

The impact of coating introduction:

Thermal stress: Local high temperature during electron beam evaporation (aluminum evaporation source approximately)1500℃) may cause surface micro zone annealing and reduce compressive stress10-15%.

Intrinsic stress:Al?O?Hard films typically exhibit200-400MPaTensile stress, when combined with glass compressive stress, forms a stress gradient.

(2)Defect repair and introduction

Positive effects:Coating can fill surface microcracks (such as<100nmofGriffithCrack), prevent crack propagation, enhanceWeibullModulus.

Experimental data: Plating100nm Al? O?Glass with fracture toughnessK?cIncrease approximately8%(From)0.75→0.81 MPa·m1/2).

Negative effects:Electron beam bombardment may generate new defects (such as non bridging oxygen vacancies), especially in high-speed deposition (>5nm/s)At that time.


2. Key influencing factors and experimental data

(1)Selection of membrane material

membrane material

refractive index

coefficient of thermal expansion(×10??/K)

Impact on strength

Al?O?

1.63

8.1

enhance15-20%(Best Match)

SiO?

1.46

0.55

Increase<5%(Low stress mismatch)

TiO?

2.40

9.0

May reduce strength (high tensile stress)

(2)The influence of process parameters

Substrate temperature:

<150The effect on the tempered layer at ℃ can be ignored (the thermal stability threshold of the ion exchange layer is about300℃)。

>200℃ will causeK?Reverse diffusion, compressive stress loss can reach up to30%.

Sedimentation rate:

Low speed(1-2nm/s)Form a dense film with significant improvement in strength;

High speed (>)5nm/s)Easy to produce columnar crystals, reducing interfacial bonding strength.

(3)Strength test comparison

#Four point bending strength test data (unit:MPa)

uncoated= 850± 50

Al?O?coating= 920 ± 40

TiO?coating= 780 ± 60

3. Process optimization plan

(1)Low temperature sedimentation technology

Electron beam scanning strategy:Adopting time-sharing scanning(duty cycle<30%)Reduce heat load and control substrate temperature rise within<80℃。

Plasma assisted:introduceECRPlasma (power<500W)Promote low-temperature densification and reduce thermal impact.

(2)Interface Engineering

Gradient transition layer design:Sedimentation first10nm SiO?Buffer layer (thermal expansion coefficient transition), then platedAl?O?, which can improve the interface integration to>5J/m2.

Post treatment annealing:
250
℃/2hVacuum annealing can release30-40%Tensile stress on the film layer without damaging the tempered layer.

(3)online monitoring

Laser ellipsometer: real-time monitoring of membrane stress (sensitivity)±10MPa).

Surface Acoustic Wave Testing: Evaluating the Depth Change of Tempered Layer (Accuracy)±2μm).


4. Typical application cases

(1)Smartphone cover plate

Requirement:
0.5mm
Chemical tempered glass(CS>600MPa)Plated with anti fingerprint film(AF+Al? O?).

Solution:

electron beam evaporation50nm Al? O?(1.5nm/s, substrate temperature120℃)

Ion beam assisted deposition(IAD,200eV Ar?)

Result:

Strength enhancement12%(From)620→695MPa)

Pencil hardness reaches9H

(2)Car display cover

Challenge:Requirements for resistance to sand and gravel impact(ISO 20567-1).

Solution:adoptAl?O? /SiO?Multilayer film (total thickness)200nm)Through stress compensation design:

single layerAl?O?:+300MPaTensile stress

single layerSiO?:-150MPacompressive stress

Net stress after multi-layer combination<+50MPa


5. Failure Analysis and Improvement

Failure Mode

root cause

improvement measures

The strength decreases after coating

The thermal effect of electron beam leads to the relaxation of compressive stress

Using pulsed electron beam(μsLevel Pulse Width

Film layer peeling off

Interface contamination or stress mismatch

increaseArPlasma cleaning (>5min)

Reduced impact resistance performance

The film layer is too thick (>300nm)

Control the total film thickness to be less than200nmAnd optimize inter layer matching


6. Future development direction

(1)Ultra-low heat load sedimentation

Laser assisted electron beam evaporation:use1064nmLaser locally heats the target material to reduce the energy demand of the electron beam.

Cold electron beam technology:Using a field emission electron source (cathode temperature<500℃)。

(2)Intelligent stress regulation

Machine learning optimization:Predicting the optimal membrane system combination based on historical data (such asAl?O? /Si? N?Proportion).

Adaptive Coating System:Adjust sedimentation parameters through real-time stress feedback (closed-loop control).

(3)Composite functionalization

antibacterialAgdopingAl?O?:Co evaporationAgTarget (content<)3at.%)At the same time as increasing strength, achieve antibacterial rate>99%.


Conclusion:

The effect of electron beam evaporation coating on the strength of chemically tempered glass cover plate has bidirectional regulation:

Positive improvement: Through defect repair and surface strengthening, it can be achieved10-20%The intensity of growth;

Risk control: Strict management of thermal effects (substrate temperature<) is required150℃) and stress matching (net tensile stress of film layer <200MPa).

Future technological breakthroughs will focus on:①Ultra low temperature deposition process (substrate temperature<50℃);②coating-Collaborative design of tempered glass layer;③Integrated application of online non-destructive testing technology.