SEMICON CHINA is here to exchange precision film thickness measurement with Unicon!
Date: 2025-03-07Read: 0
The SEMICON CHINA 2025 Semiconductor Industry Expo will be held from March 26th to 28th at the Shanghai New International Expo. Younikon brings a variety of precision measuring equipment to the exhibition, welcome new and old friends to visit!
Identify the QR code belowAppointment for Exhibition RegistrationSEMICON
Location: Shanghai
New International Expo Center
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Partial exhibition facilitiesprepare
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F50 film thickness measuring instrument |
F50 can easily achieve maximum straightThickness distribution map of sample film with a diameter of 450 millimeters. Using an r - θ polar coordinate moving platform,Can quickly locate the required test points and obtain real-time test thickness, approximatelyTest two points per second. |
Related applications:Semiconductor manufacturing (photoresist, oxide/nitride/SOI, wafer backside grinding); LCD liquid crystal display (polyimide, ITO transparent conductive film); Optical coating (hard coating, anti reflection layer); MEMS microelectromechanical systems (photoresist, silicon-based film layers). |
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The P-7 can perform 2D and 3D measurements of step height, roughness, curvature, and stress, with a scanning range of up to 150mm without the need for image stitching. |
Related applications:Thin film/thick film step; Etching depth measurement; Photoresist/photoresist step; Flexible film; Surface roughness/flatness characterization; Surface curvature and contour analysis; 2D stress measurement of thin films; Surface structure analysis; 3D contour imaging of the surface; Defect characterization and defect analysis. |
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R50 four probe resistivity measuring instrument |
The Filmetrics R50 series offers contact based four point probes (4PP) and non-contact eddy current (EC) measurements. Map the resistivity/conductivity of the conductive film at a speed of 1 point/second at the fastest. The electric X-Y stage uses standard chip suction cups to customize sample racks, which can measure up to 300mm of samples or 200mm of area. |
Related applications:Silicon wafer doping; Metal layer thickness testing; Wafer resistivity test |
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Bowman XRF Coating Thickness Gauge |
On workpieces with a height not exceeding 9 inches, it has a 12 x12 inch measurable area that is superior to similar products. Automatic multi collimator allows for the selection of spot size to accommodate various feature sizes; The zoom camera allows measurement within a focal length range of 0.25 inches to 3.5 inches. |
Related applications:Measurement of refractive index and extinction coefficient of materials; Thickness testing of natural oxide layer on silicon wafer; Optical constant testing of photoresist; Measurement of Metal Thickness on Silicon in Semiconductor Packaging |
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FS-1 multi wavelength ellipsometer |
The Film Sense FS-1 multi wavelength ellipsometer uses a long-life LED light source and a non moving component ellipsometer detector, which can achieve reliable thin film measurement in a compact ellipsometer with simple operation. |
Related applications:Silicon dioxide and nitrides, high dielectric and low dielectric materials, amorphous and polycrystalline materials, silicon thin films, photoresist.High and low index thin films, such as SiO2, TiO2, Ta2O5, MgF2.TCO (such as ITO), amorphous silicon thin films, organic thin films (OLED technology), etc |
