Transmission electron microscopy force electric in-situ systemIt is an in-situ characterization device that integrates mechanical loading, electrical testing, and high-resolution imaging of transmission electron microscopy. The core is to install scanning probes, force sensors, and electrical testing units in the transmission electron microscopy sample rod, which can synchronously obtain material atomic scale microstructure and electromechanical performance data. It is widely used in the study of microstructure performance relationships in nanomaterials, new energy materials, and other fields.

　　Transmission electron microscopy force electric in-situ systemIt mainly consists of the following parts:

In situ force electric sample rod: As the core component, the sample rod is equipped with a MEMS chip to achieve multi field automatic control and feedback measurement of force and electric composite. Its design needs to meet the cavity space limitations of transmission electron microscopy, while ensuring high mechanical stability and good electromagnetic shielding performance to avoid interference with the imaging optical path.

MEMS mechanical powered chip: processed using Micro Electro Mechanical Systems (MEMS) technology to achieve independent control of electric field and mechanical loading. Chip design needs to balance high-precision mechanical loading and electrical signal transmission.

Mechanics temperature control system: supports dynamic mechanical performance testing under high temperature conditions, meeting the in-situ characterization requirements under extreme working conditions.

Electrical controller: Integrated current and voltage testing unit, supports automatic current voltage (I-V) measurement, current time (I-t) measurement, and has automatic data saving function. The voltage output range covers normal mode ± 10V and high voltage mode ± 150V to meet different experimental requirements.

Nanoprobe manipulation system: High precision manipulation of the probe is achieved through piezoelectric ceramic driving, ensuring smooth movement of the probe and achieving high-resolution in-situ observation experiments.

Attachment package and needle tip preparation system: Provide auxiliary tools and needle tip preparation equipment required for the experiment to ensure the integrity and convenience of the experimental process.