Features:

Non destructive measurement
No need to touch or damage the sample, multiple retests can be conducted on finished and semi-finished products to avoid sample loss.

High precision and wide range

Accuracy: Conventional model ± 2nm~± 5nm;

Range: Covering from 1nm to several hundred microns, some models support multi-layer film measurement.

Fast and efficient
The single measurement time is short, with a simple version taking about 0.1 to 1 second and a spectroscopic method taking about 3 to 5 seconds, which can meet the "online detection" needs of the production line.

Easy to operate
Built in refractive index database for common materials, no need to manually input parameters; Some models support "one click measurement", which can be operated without professional optical knowledge.

Strong environmental adaptability
Industrial grade models have dust-proof and shockproof designs, and can work stably in workshop environments; The laboratory model supports constant temperature control (± 0.5 ℃) to further enhance data stability.

Reflective film thickness gaugePrecautions for use:

Sample pretreatment: Ensure that the surface of the sample is clean (free of dust and oil stains), otherwise it will affect the reflected light signal and cause measurement errors;

Environmental control: High precision laboratory measurements should avoid direct sunlight and airflow disturbances, and industrial scenes should be kept away from vibration sources;

Regular calibration: Use standard film thickness samples for monthly calibration to ensure instrument accuracy;

Parameter matching: Before measurement, it is necessary to confirm whether the refractive index of the film and the substrate type are consistent with the instrument settings.