More and more published scientific literature proves thatQSense^®The reliability of technology.

The core of this technology is the oscillation of quartz crystals at a specific frequency under load voltage. When the mass on the surface of the crystal changes, the oscillation resonance frequency of the crystal will also change accordingly. Through this method, interface quality and structural changes can be measured at nanogram level sensitivity. This method can measure the surface of any material that can form a thin film in real-time without the need for labeling.

QSense^®It can measure changes in quality and also measure dissipation factors simultaneously, providing information on the structure and viscoelasticity of the film. It can provide information such as the molecular thickness, structure, and moisture content of the adsorption membrane. In addition, changes in the surface adsorption layer before and after neutralization can also be detected.

Metal, polymer, and chemically modified surfaces, as long as they can be spread into thin films on the surface of chips, can become our customized chip coatings.