Display video of Langsheng desktop X-ray diffractometer

FRINGE desktop X-ray diffractometerWhen the X-ray beam passes through SolaslitThe diverging slit is irradiated onto the sample, and the sample stage is located at the center of the angle measuring instrument. Based on the reflection geometry θ s - θ d, the X-ray beam undergoes diffraction in a specific direction when satisfying Bragg's law. It passes through the anti scattering slit and Sola's lawslitThe receiving slit reaches the X-ray detector, and finally the collected diffraction pattern is displayed on the analysis software through the data processing system.

Jie FRINGE is easy to operate, with high analysis speed, extremely low detection limit, and strong stability, making it very suitable for user operation in industrial, academic research, and other fields. The compact and lightweight appearance, as well as the easy-to-use design, are very space saving and suitable for every office desk. Simply prepare a standard power socket and spend a few minutes to complete the qualitative and quantitative analysis, crystal structure analysis, material structure analysis, and crystallinity determination of samples in powder, block, or film forms. It is an ideal choice for various material structure analyses.