Total Reflection X-ray Fluorescence Spectrometer (TXRF) is a scientific instrument used for multi-element trace analysis, which achieves rapid and high-sensitivity detection of major and trace (including ultra trace) elements in liquid, suspension, solid, and pollutant samples through total reflection X-ray fluorescence technology.
TXRF irradiates the surface of the sample with X-rays at very small angles (usually below 0.1 °), causing total reflection of the X-rays. At this point, the incident X-rays are no longer scattered by the sample, but only excite the micrometer sized material on the surface of the sample, producing characteristic X-ray spectra. This process significantly reduces the interference of scattered photons on the detector signal, resulting in a significant reduction in background noise (about four orders of magnitude lower than conventional XRF), thus achieving the detection of trace elements at the nanogram (ng) level.
When X-rays are incident on the surface of a sample carrier (such as a quartz plate) at angles less than the critical angle (usually 0.1 ° -0.5 °), total reflection occurs to avoid absorption and scattering of X-rays by the carrier; The elemental atoms in the sample (uniformly spread on the surface of the carrier, thickness ≤ 100nm) are excited and emit characteristic X-ray fluorescence (XRF); Collecting energy and intensity of characteristic X-rays through detectors, identifying element types based on energy, and quantitatively calculating element content based on intensity.
Features:
High sensitivity and low detection limit: suitable for analysis of ultrafine particles and trace elements.
Low sample usage: Only micro upgrades or microgram level samples are needed to complete accurate analysis, especially suitable for situations with limited sample sizes.
No matrix effect: The total reflection geometry configuration reduces the interference of the sample substrate on the measurement results, making quantitative analysis simpler.
Fast non-destructive testing: The single testing time can be shortened to less than 5 minutes without damaging the sample.
Multi element analysis capability: It can simultaneously detect multiple elements, such as eight major heavy metal elements including chromium and lead, or expand to nearly 30 elements according to demand.
Easy to operate and safe: The touch interface is intuitive, and the risk of radiation exposure is low, ensuring the safety of operators.