Breaking the limitations of sample testing | Flytime Mann head scanning atomic force microscope

The probe scanning atomic force microscope (FM Nanoview LS-AFM) breaks through many limitations of traditional atomic force microscope structures and sample measurement, and is the first mass-produced and commercialized atomic force microscope that can achieve scanning with the probe moving while the sample remains stationary. Breaking the limitations of atomic force microscopy in measuring sample size and weight in the past. While being suitable for measuring ultra large samples, Feishiman also enhances the scalability of the sample stage, achieving convenient in-situ measurement of multiple instruments. Customized probe scanning atomic force microscopes can be made according to customer needs. Widely used in the measurement and research of semiconductor materials and graphene materials.