Atomic force microscopy, abbreviated as AFM, is a high-resolution microscopy technique. It can accurately measure and analyze the surface morphology, physical properties, and chemical characteristics of substances at the nanoscale. The force generated by the interaction between a tiny probe and the sample surface will cause the probe to undergo a slight displacement. These displacements are captured by highly sensitive detection systems and converted into images and data. The interaction forces between the probe and the sample surface include van der Waals forces, electrostatic forces, magnetic forces, etc. By controlling and measuring these forces, atomic force microscopy can obtain various information about the sample surface.

The advantages of atomic force microscopy are significant. Firstly, it has high spatial resolution and can distinguish the structure and morphology of individual atoms and molecules. This enables scientists to delve into the microstructure and properties of matter, providing key tools for research in fields such as materials science, physics, and chemistry. Secondly, it can operate at room temperature and pressure, with relatively low requirements for samples. It can not only measure solid surfaces, but also study liquid and biological samples.

Atomic force microscopy plays an important role in many scientific research fields. In materials science, it is used to study the surface roughness, crystal structure, and physical properties at the nanoscale of materials, providing important basis for the development of new materials; In the field of biology, being able to observe the structure and function of biomolecules such as proteins and DNA helps us better understand the mysteries of life; In the field of chemistry, the process of chemical reactions occurring on surfaces and the mechanism of catalyst action can be studied.

With the continuous development of technology, atomic force microscopy is also constantly evolving and improving. The emergence of multi-mode atomic force microscopy has made it possible to simultaneously measure multiple physical properties; High speed atomic force microscopy greatly improves imaging speed and enables real-time observation of dynamic processes.