Optimization Plan for IT2800 Source Meter Nano An (A) Level Low Power Test

With the rapid development of microelectronics technology and the improvement of design level, the integration degree and computational data volume of chips have significantly increased This leads to a sharp increase in the power consumption of the chip. Therefore, the chip needs to undergo low-power design and testing. Some electronic products in the same daily life, such as IoT devices, portable battery powered products, etc., must also undergo low-power testing to ensure long-term operation.

Characteristics of low-power testing

Static current is getting lower and lower, uA sleep current, and even nA level leakage current

The signal is complex, with a large range of dynamic current changes, and the emission of microampere (uA) sleep current can reach several hundred mA or even several A

current

The current pulse width is narrow, generally ranging from a few hundred microseconds to milliseconds

Requires high sampling rate and long-term continuous measurement

Low power testing plan

Traditional solution 1: High performance power supply+digital multimeter

This is mainly because low-power testing often has fast dynamic characteristics, requiring high power supply accuracy and fast response speed. In addition, the power supply itself has a slow read back speed. To avoid missing current transients, it is often necessary to use a digital multimeter for data acquisition.

Traditional solution 2: Power analyzer+high-precision power supply/source meter

Using a power analyzer to analyze and record data instead of a digital multimeter is very expensive, and sometimes requires the use of paid software to complete testing