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Fee Standards for Partial Testing Services of Shanghai Zhongchen Digital Technology Equipment Co., Ltd
Date: 2021-05-14Read: 0
Fee Standards for Partial Testing Services of Shanghai Zhongchen Digital Technology Equipment Co., Ltd
Test Project Fee standard (yuan/sample) Instrument Model Explanation

Surface tension test

Interface tension test

Hanging ring method

Hanging method

room temperature 200.00 JK99 series
Room temperature~95 ℃ 300.00 JK99 series
Low temperature or above 95 ℃ 400.00 JK99 series
Bubble pressure method 1-20 bubbles per second 400.00 JBT07 series Dynamic surface tension
Rotating droplet method Room temperature~95 ℃ 280.00 JJ2000 series Suitable for ultra-low interfacial tension
CMC Room temperature~95 ℃ 2000.00 JK99 series Critical micelle concentration
Contact angle test Conventional contact angle room temperature 200.00 JC2000 series Optical contact angle
Room temperature~200 ℃ 300.00 JC2000 series Optical contact angle
200℃~400℃ 400.00 JC2000 series Optical contact angle
surface free energy Qwens Two Liquid Method 380.00 JC2000 series
Qwens Three Liquid Method 550.00 JC2000 series
Powder contact angle Tableting Method 300.00 JC2000 series Require the powder to be compressed into tablets for molding
Washburn infiltration method 500.00 JF99 series Require powder size greater than 200 mesh
Zeta potential test Aqueous solution room temperature 280.00 JS94 series Microelectrophoresis method
organic solution room temperature 320.00 JS94 series Microelectrophoresis method
Nano bubble testing Nano bubbles can exist for weeks to months, and can be sampled and sealed for testing to obtain a large amount of data and charts such as nano bubble particle size and concentration Malvern Nanosight Light scattering method
Micro bubble test Due to the short lifecycle of microbubbles, sampling and measurement are not possible. In situ immersion online observation is used to obtain a large amount of data such as micro bubble particle size, and observe the real-time action and change process of micro bubbles JWNP-WJS series Microscopic imaging method