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Shanghai Xiangfeng Experimental Instrument Equipment Factory
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Shanghai Xiangfeng Experimental Instrument Equipment Factory

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    554377110@qq.com

  • Phone

    15201768300

  • Address

    No. 329 Yangyue Road, Yangwang Economic Park, Fengxian District, Shanghai

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Shanghai Xiangfeng Testing Instrument Equipment Factory and Tianchengda (Kunshan) Electronics Co., Ltd. signed a contract for high and low temperature alternating humidity test chamber

Model: XF/GDWJS-500L
High and low temperature alternating humidity test chamber
Technical Specifications
1. Temperature range: -40 ℃ to 150 ℃
2. Temperature uniformity: ≤± 2 ℃ (when unloaded)
3. Temperature fluctuation: ± 0.5 ℃ (when unloaded)
4. Temperature deviation: ≤± 2 ℃
5. Cooling rate: 0.7-1.2 ℃/min
6. Heating rate: 1.0-3.0 ℃/min
7. Time setting range: 0-999 hours
8. Temperature fluctuation range: -40~150 ℃
9. Noise: < 65dB
Jinan High and Low Temperature Test Chamber
3、 Equipment structure introduction:
1. The outer shell is processed and formed using high-quality (t=1mm) A3 steel plate CNC machine tools, and the surface of the shell is sprayed with plastic for a smoother and more beautiful appearance.
2. The inner liner adopts imported high-grade stainless steel (SUS304) mirror panel.
3. Insulation material: high-density glass fiber cotton The insulation thickness is 100mm
4. Temperature cycle system: using a specially designed low-noise long axis fan motor with stainless steel multi blade impellers that are resistant to high and low temperatures, to achieve strong convection and vertical diffusion circulation.
5. Double layer high tensile sealing strips with high temperature resistance are used between the door and the box to ensure the sealing of the testing area
6. Using non reactive door handles makes operation easier
7. The bottom of the machine adopts high-quality fixed PU movable wheels
8. The observation window is made of multi-layer insulated tempered glass, and the inner side is coated with laminated conductive film for heating and defrosting (clearly observe the test process)
9. The test hole (on the left side of the machine) can be used for external testing power or signal lines (the aperture or number of holes needs to be increased and indicated)