Wafer inspection microscopeEquipped with a stage with a large moving range, a falling beam illumination device, a flat field achromatic objective lens, and a large field eyepiece, the image is clear and the contrast is good. At the same time, it is equipped with a polarizing device. The wafer inspection microscope is an ideal instrument for research in metallurgy, mineralogy, precision engineering, electronics, and other fields. The wafer inspection microscope is a high-tech product developed by combining advanced optical microscopy technology, advanced photoelectric conversion technology, and computer imaging technology.Wafer inspection microscopeIt is possible to manually observe metallographic images and conveniently capture them on a computer at any time for analysis, grading, and printing of high-resolution metallographic photographs. The wafer inspection microscope is suitable for use in schools, scientific research, factories, and other departments.

Function of wafer inspection microscope:

The 20X eyepiece, auxiliary objective lens, etc. all have anti-static functions. This function is very useful for observing samples that require anti-static, such as semiconductor chips, in wafer inspection microscopes.

Sealing function: The zoom tube and 10X/20X eyepiece both have sealing function, making it convenient to use the wafer inspection microscope in environments with high humidity such as oil, gas, and water vapor.

Innovative human-machine design ensures that operators can operate comfortably for extended periods of time.

The wafer inspection microscope has the characteristics of high definition, large field of view, and long working distance,Wafer inspection microscopeWidely used in teaching demonstrations, biotechnology, IT industry testing, and other fields.

After connecting the imaging card, the instrument can be connected to a computer for single image saving and continuous image acquisition.

The wafer inspection microscope has a fine adjustment focus function that can accurately and clearly adjust the focal length at high magnification.