This instrument adopts the 3 Ω testing method to detect the thermal conductivity of micro/nano thin film materials by detecting the changes in the electrical signal of the heater caused by thermal conductivity.
The main application scope is the measurement of thermal conductivity of micro/nano thin film materials, which can be widely used to assist in the research and development of various functional thin film materials
Its scope includes higher education institutions and research institutes, integrated circuit heat dissipation materials, aerospace materials, thermoelectric materials and devices
Information storage and optoelectronic devices.