This instrument uses the quasi dynamic method (with technology) and the four probe method to measure the Seebeck coefficient and resistivity of the sample, respectively.no
Can only be used to measure semiconductor block samples, metal half metal samples such as copper, nickel, bismuth, and non-metallic samples such as graphite and carbon materials
Seebeck coefficient and resistivity can also be measured for thin film (nano) samples.

*Advantages
Having independent intellectual property rights and acquiring multiple technologies;
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The dynamic method for measuring Seebeck coefficient avoids the systematic errors in temperature difference measurement caused by traditional static measurement methods, resulting in more accurate measurements;
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Seebeck coefficient and resistivity measurements do not share voltage probes to avoid the problem of micro thermocouple fracture failure;
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Adopting a bidirectional heating system;
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Automatic power-off protection;
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Comes with a thin film attachment (no need for a host, direct use), which can directly measure the Seebeck coefficient and resistivity of thin film materials at room temperature.