Recently, our company has launched its latest product,KSA XRF online X-ray fluorescence film thickness measuring instrumentOptical methods for measuring the thickness of metal and dielectric films with thin film layers are not very reliable.KSA XRF online X-ray fluorescence film thickness measuring instrumentThe main purpose of its launch is to solve this problem, as it can measure the thickness of thin films on many different material substrates (such as glass and solar cell modules) online.
1.Equipped with a protective customized frame casing, it houses the X-ray source and detector.
2.This device bridges the transmission line for easy device installation and factory user access to the system.
3.When the X-ray source is in use, a warning light will flash to indicate.
4.Equipped with front/rear edge photoelectric detectors for triggering automatic start stop of the equipment.
5.The cabinet controller provides data processing and storage functions.
6.Equipped with a small lighthouse to indicate the detection situation.
1.Some ultra-thin dielectric films are difficult to measure their thickness using optical methods, such as films with a thickness below 100nm; In this case, kSA XRF can be measured very well.2.Metal film thickness can be measured on various substrates.3.Real time data collection, detection of film thickness defects and online feedback.4.The software functions can be customized, and users can set them according to specific requirements.5.During the testing process, quality control can be verified to ensure that the coating thickness is within the tolerance range.6.Factory integration function: enables factory users to integrate equipment into existing systems such as factory alarms, PLCs, email alarms, etc.7.Easy to operate, almost no additional settings required, only the operator needs to perform regular equipment calibration.
make, do, create, compose, write, etc.
1.The system consists of an X-ray tube with a high-voltage generator and an X-ray detector system.2.Its X-ray detection system combines solid-state detectors, amplifiers, pulse height analyzers, and multi-channel analyzers.3.After energy calibration of the spectrometer, the system automatically identifies X-ray spectral peaks and collects peak intensities for further processing.4.This tool can measure the corresponding atomic species based on the customer's film formula and measurement requirements.
1.Use proprietary k-space software to measure, analyze, and store data.2.Can communicate with existing quality control systems.3.Use the trigger of the photodetector to start and stop data acquisition.4.Specially designed for typical glass and solar panel conveying speeds.5.fully automaticMechanization, able to communicate and connect with factory automation.6.Alarm signals can be easily customized and configured.7.A single detection head can be placed at any position on the width of the panel, and multiple detection heads can be optionally used.8.The thickness measurement range is 0-500 nm ± 1 nm, and the sensitivity and measurement uncertainty depend on the measured element.
