The Leica EM TXP target surface preparation system has the function of fixed-point block polishing. After sawing, grinding, milling, and polishing the sample, it is used for scanning electron microscopy, transmission electron microscopy, and LM technology detection.

Equipped with an integrated sight glass, used for positioning and observation during sample processing of finer and more difficult to observe target positions; By using the sample rotation handle, the observation angle of the sample can be adjusted from 0 ° to 60 °, or observed perpendicular to the front surface of the sample at a 90 ° angle. The distance can be measured using the eyepiece scale ruler.