Electrical resistivity ultra-high temperature probe stationIt is an advanced device used for accurately measuring the resistivity of materials under high temperature conditions.

Core functions:

Resistivity measurement

By combining the four probe method with high-temperature environments, the resistivity of semiconductor materials, conductive thin films, metal materials, and other materials at high temperatures can be accurately measured, providing key data for materials science research.

Variable temperature electrical performance testing

It can characterize the temperature dependent changes in the electrical properties of materials, such as resistance and conductivity, and support a wide range of testing from room temperature to ultra-high temperatures (such as 1700 ℃).

Multi parameter synchronous analysis

Integrate electrical modules (probes, displacement mechanisms, interfaces) and optical modules (reflection/transmission optical paths), supporting real-time synchronous acquisition and curve display of resistivity, temperature, conductivity, and other data.

　　Electrical resistivity ultra-high temperature probe stationTechnical characteristics:

Ultra wide temperature range and high-precision temperature control

Temperature range: RT (room temperature) to 1700 ℃, some models support 4K low temperature to ultra-high temperature.

Temperature control accuracy: ± 0.1 ℃, ensuring that temperature stability minimizes the impact on resistivity measurement.

Temperature control method: integrates multiple solutions such as liquid helium refrigeration, liquid nitrogen refrigeration, thermoelectric refrigeration, resistance heating, infrared heating, laser heating, etc., to meet different experimental needs.

Four probe method and high-precision probe

Using four probe testing fixtures (linear or equidistant) to eliminate the influence of contact resistance and improve measurement accuracy.

The probe material can be selected from gold-plated tungsten needles, tungsten steel rhenium needles, etc,cutting edgeDiameter up to 10 μ m, supporting nanoscale sample testing.

Modular design and high compatibility

The probe station is divided into internal adjustment, external adjustment, electronic control adjustment and other types, suitable for different sample sizes and testing scenarios.

Supports multiple language SDKs (such as Labview, C #) for easy integration with external measuring instruments (source tables, digital multimeters).