X-ray emission spectrometerXES has become a key tool for studying substance composition, structure, and reaction mechanisms in chemical analysis due to its high element sensitivity and chemical state resolution ability.

　　X-ray emission spectrometerChemical state resolution and microanalysis:

Chemical state resolution capability

XES can distinguish different oxidation states or coordination environments of the same element by measuring the chemical shift (i.e. spectral peak shift) of characteristic X-rays. For example:

The oxidation state of iron: The difference in K α emission energy between Fe ² ⁺ (such as FeO) and Fe ³ ⁺ (such as Fe ₂ O3) is about 1-2 eV, which can be clearly distinguished by XES.

The valence states of sulfur: S ² ⁻ (sulfide) and SO ₄ ² ⁻ (sulfate) have significant differences in S K α line energy, which are used for tracing environmental pollutants.

Micro area and non-destructive analysis

By combining scanning electron microscopy (SEM) or transmission electron microscopy (TEM), XES can achieve chemical state mapping at the micrometer to nanometer level, revealing material inhomogeneity.

No need for complex sample preparation, suitable for non-destructive analysis of brittle or heterogeneous materials such as ceramics and biological tissues.