The Beidou satellite navigation RF chip is a key component of the navigation system, and its performance determines the navigation accuracy of the system. By analyzing the structural characteristics of satellite navigation RF chips, testing and analysis were conducted on the main parameters. Based on the integrated circuit automatic testing system (ATE), performance testing of satellite navigation RF chips is achieved by combining RF testing equipment. Why does satellite navigation need to use a rapid temperature change test chamber for testing? It can mainly accelerate efficiency, improve product quality and service life in different environments, and quickly improve the aging performance in satellite navigation electronics.

The main environmental testing equipment for satellite navigation electronics

1. We use high, low temperature, and low pressure test chambers for testing because we need to test signals in the air environment, so we simulate different climates in different environments.

2. The main purpose of using a rapid temperature change test chamber is to increase or decrease the temperature linearly from 10/MIN to 25/MIN.

3. By using a cold and hot shock test chamber, it is possible to detect the chemical changes or physical damage caused by thermal expansion and contraction of the sample in a short period of time, based on the degree to which the material structure or composite material can withstand continuous high and low temperature environments in an instant.

Jiangsu BeidouOn site equipment shooting